Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 19
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 19 - August 2013

Contents

Page 66 of 70

Physical Sciences

P06.03 Failure Analysis of Structural Materials: Microscopy, Metallography and Fractography

Abstract

  • Structural Analysis of Branched Boron Carbide Nanostructures

  • B. Cao, Z. Guan, T. Xu
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1848-1849
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Influence of ion beam damage by FIB on the RESET amorphous volume observation in phase change random access memory device

  • J. Oh, Y. Jang, S. Jeon, T. Lee, W. Kim, H. Kim, C. Kim
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1850-1851
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

P06.P1 Failure Analysis of Structural Materials: Microscopy, Metallography and Fractography

Abstract

  • Failure Analysis and Quantitative Image Analysis of Leaded Brass Components

  • D.F. Susan, A.C. Kilgo, R.P. Grant, G.D. Grimm
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1854-1855
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • On the Study of the Orientated Cracks Formed in ErD2 Thin Film

  • H. Shen, K. Sun, X. Xiang, X. Zu
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1856-1857
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • TEM Investigation of Implanted Ag Distribution in PyC and SiC after Annealing

  • G. Yu, S. Dwaraknath, G. Ran, G. Was, L. Wang
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1860-1861
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

P07.01 Special Problems and Solutions: Coatings, Ceramics and Polymers

Abstract

  • Characterization of Coatings with Ions and Electrons

  • L.A. Giannuzzi, N.S. Smith, S. Sampath
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1862-1863
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Benefits of Using a Biological Confocal Microscope to Resolve Difficult and Unusual Problems in Material Science

  • E.J. Sanford
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1864-1865
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Microstructural Characterization of a Thermal Barrier Coating System Using SEM, TEM and APT Techniques

  • Y. Chen, R.C. Reed, E.A. Marquis
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1866-1867
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Three-Dimensional Cathodoluminescence by Focused Ion Beam - Scanning Electron Microscopy

  • M. De Winter, G.M. Pennock, J.A. Post, M.R. Drury
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1868-1869
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

P07.02 Special Problems and Solutions: Coatings, Ceramics and Polymers

Abstract

  • Imaging Cellulose Nanocrystals

  • I. Sacui, H. Szmacinski, D.L. Blair, J.S. Urbach, M. Zammarano, J.W. Gilman
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1870-1871
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Non-Destructive Measurement of a Combinatorial Materials Library for All-Oxide Solar Cells

  • C. Lang, S. Rühle, A.Y. Anderson, A. Zaban, P. Statham, S. Burgess
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1872-1873
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Microstructural Characterization of Ion Implantation Effects in Aluminum Nitride Substrates for Energy-Scavenging Applications

  • F.S. Alleyne, R. Gronsky
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1874-1875
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atomic Scale Dynamics of a Manganese Oxide Phase Change Observed with STEM

  • T.J. Pennycook, L. Jones, H. Pettersson, V. Nicolosi, P.D. Nellist
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1876-1877
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Effects of Alkali Treatment On the CaP Deposition of Ti6Al4V Foams Produced by Two Different Particle Size

  • U. Turkan, M. Guden, F. Kazak
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1880-1881
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

P07.03 Special Problems and Solutions: Coatings, Ceramics and Polymers

Abstract

  • Laser and Material Effects on Laser Pulsed Atom Probe Analysis of Oxide and Nitride Ceramics

  • B.P. Gorman, D.R. Diercks, R. Kirchhofer
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1882-1883
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Interface Evolution of Flux-Grown BaTiO3 Thin Films on Sapphire Substrates

  • J. Li, M. Burch, D.T. Harris, J.-P. Maria, E.C. Dickey
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1886-1887
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 66 of 70