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Advanced Characterization of Nanoscale Bridge in Magnetic Tunnel Junction by 3-D EDS Tomography

Published online by Cambridge University Press:  09 October 2013

K. Hwang ,
J. Bae ,
S. Lee ,
M. Park ,
K. Park ,
J. Choi ,
J. Ahn ,
D. Lee ,
S. Ahn  and
S. Park
...Show all authors
K. Hwang
Affiliation:
J. Bae
Affiliation:
S. Lee
Affiliation:
M. Park
Affiliation:
K. Park
Affiliation:
J. Choi
Affiliation:
J. Ahn
Affiliation:
D. Lee
Affiliation:
S. Ahn
Affiliation:
S. Park
Affiliation:
S. Jeong
Affiliation:
S. Nam
Affiliation:
G. Jeong
Affiliation:
H. Cho
Affiliation:
E. Jung
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1852 - 1853
Copyright
Copyright © Microscopy Society of America 2013