Direct Phase Imaging with Coherent Electron Beam in TEM
Hollow-cone Foucault Imaging of Magnetic Textures in Hexagonal Ferrite ; BaFe10.35Sc1.6Mg0.05O19
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- 30 July 2020, pp. 1766-1769
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Exploring the Local Energy Landscape of Aperiodic Artificial Spin Ices via Lorentz TEM
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- 30 July 2020, pp. 1770-1771
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A New Type of Domain and Interacting Bloch-lines in a Dzyaloshinskii-Moriya Multilayer Thin Film
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- 30 July 2020, pp. 1772-1773
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Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Proposal: Let's Develop a Community Consensus K-ratio Database
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- 30 July 2020, pp. 1774-1776
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Can the ISO 14595 Method be Used to Validate the Heterogeneity and Composition of Natural Mineral Standards Using WDS And/or EDS?
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- 30 July 2020, pp. 1778-1780
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Using Multi-Element Reference Materials for Approximating Concentrations in Soils and Sediments from Micro XRF Spectra
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- 30 July 2020, pp. 1782-1784
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Adventures with Oxides: Utilizing Commercial and Internal Reference Materials for Geological and Materials Science Samples
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- 30 July 2020, pp. 1786-1787
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Matrix-Bracketing Blanks & Peak Overlap Correction for Ti-V-Cr in Diverse Tourmalines
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- 30 July 2020, pp. 1788-1789
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Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Correlation of Spectroscopic Methods with Microanalysis
Studying the UO2 Electrochemistry In Situ Using SEM
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- 30 July 2020, pp. 1790-1792
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Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy II - Detection and Subtlety
Capturing the Atomic Coordinates of Surface and Subsurface Structure in 4D with Atomic Electron Tomography
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- 30 July 2020, pp. 1794-1796
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Multidimensional Sample Surface Analysis by AFM-in-SEM
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- 30 July 2020, pp. 1798-1799
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In-situ Correlative Analysis of Electrical and Mechanical Properties of 3D Nanostructures by Combination of AFM, SEM and FIB
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- 30 July 2020, pp. 1800-1801
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Latest Advances in Nanoscale Chemical Imaging and Spectroscopy
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- 30 July 2020, pp. 1802-1803
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Vendor Symposium - Imaging
Ultra-high Energy Resolution EELS
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- 30 July 2020, pp. 1804-1805
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An Optimized In-column Detection System for the Ultra-high Resolution BrightBeamTM SEM Column
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- 30 July 2020, pp. 1806-1807
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High-resolution Multimodal Confocal Raman-imaging in SEM by Means of RISE Microscopy
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- 30 July 2020, pp. 1808-1809
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NanoMi: An Open Source (Scanning) Transmission Electron Microscope.
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- 30 July 2020, pp. 1810-1811
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Microbes in Focus
Cryo-EM of Helical Polymers at Near-atomic Resolution Yields Many Surprises
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- 30 July 2020, pp. 1812-1813
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Structural Study of the Legionella pneumophila Dot/Icm T4SS Using Cryo-electron Microscopy
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- 30 July 2020, pp. 1814-1815
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Imaging Fungal Contamination of Protective Organic Coatings
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- 30 July 2020, pp. 1816-1817
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