Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 15 supplement s2
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 15 - Supplement S2 - July 2009

Contents

Page 14 of 39

Instrumentation and Techniques

Problem Solving Using Microanalysis in the Real World

Abstract

  • The Discovery and Characterisation of a New U Mineral from Ilimaussaq Alkali Complex – Greenland

  • CM MacRae, A Torpy, N Wilson, I Grey, R Townend
  • Published online by Cambridge University Press:
    26 July 2009, pp. 522-523
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Metallography And Microanalytical Analysis Of Particles In Iron Rivets Recovered From The Wreck Of The RMS Titanic

  • T Foecke, J Hooper-McCarty
  • Published online by Cambridge University Press:
    26 July 2009, pp. 524-525
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • EPMA of K and Na in Two Types of Aged NOx Catalysts for Diesel Engines

  • J Hangas, G Cavataio, Y Cheng
  • Published online by Cambridge University Press:
    26 July 2009, pp. 526-527
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Prospects for Single Standard Quantitative Analysis with SDD

  • P Statham
  • Published online by Cambridge University Press:
    26 July 2009, pp. 528-529
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Solution to the Problem of X-Ray Mapping Samples with Surface Roughness

  • R Anderhalt, D Chan, M Lupu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 530-531
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Elevation Resolved Elemental Mapping with SEM/EDS

  • J Konopka, M Betts
  • Published online by Cambridge University Press:
    26 July 2009, pp. 532-533
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Transitioning Laser Ablation ICP-MS from Research Applications to Routine Trace Element Microanalysis: A Look at Quantitative Trace Element Analyses and Imaging

  • AE Koenig
  • Published online by Cambridge University Press:
    26 July 2009, pp. 536-537
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Laser Ablation Inductively Coupled Mass Spectrometry for in situ Trace Element and Isotope Analysis

  • RD Ash
  • Published online by Cambridge University Press:
    26 July 2009, pp. 538-539
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microanalysis Data Formats: Are We Even Asking the Right Questions?

  • JH Scott, N Ritchie
  • Published online by Cambridge University Press:
    26 July 2009, pp. 540-541
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Solving the Micro to Macro Problem: A New Application for Milli X-ray Fluorescence X-ray Spectrum Imaging

  • JM Davis, DE Newbury, N Ritchie, EP Vicenzi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 542-543
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Strategies for the Microcharacterization of Structural Defects in Wide Band Gap Materials Using Cathodoluminescence Microanalysis.

  • M Stevens-Kalceff
  • Published online by Cambridge University Press:
    26 July 2009, pp. 544-545
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • How Much EDS Resolution Do I Need?

  • NA Bulloss
  • Published online by Cambridge University Press:
    26 July 2009, pp. 546-547
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Thin Film CuCr2Se4 Synthesized by A Modulated Elemental Reactant Deposition

  • MD Anderson, J Roberts, K Kirchgessner, L LaRossa, IM Anderson, DC Johnson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 550-551
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nano Analysis of Silver Nanoparticles in Commercial Socks

  • A Hemmati, K Scott, JM Davis
  • Published online by Cambridge University Press:
    26 July 2009, pp. 552-553
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Investigations on Toxic Compound Traces in Powders and Sintered Ceramics

  • J-L Longuet
  • Published online by Cambridge University Press:
    26 July 2009, pp. 556-557
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Resampling of SEM-EDS Element Maps to Assess the Length-Scale of Elemental Heterogeneity

  • C Todd, W Heeschen, A Pyzik, C Han
  • Published online by Cambridge University Press:
    26 July 2009, pp. 558-559
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Improved Performance of a Commercial SDD for X-ray Microanalysis

  • E Kenik
  • Published online by Cambridge University Press:
    26 July 2009, pp. 560-561
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Breaking the Light Barrier: Overcoming Diffraction-Limited Microscopy

Abstract

  • Infrared and Raman Microscopy: Pushing the Limits of Spatial Resolution

  • T Tague
  • Published online by Cambridge University Press:
    26 July 2009, pp. 562-563
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 14 of 39