Prospects for Single Standard Quantitative Analysis with SDD

P Statham

doi:10.1017/S1431927609096007

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Hodoroaba, Vasile-Dan and Procop, Mathias 2014. A Method to Test the Performance of an Energy-Dispersive X-Ray Spectrometer (EDS). Microscopy and Microanalysis, Vol. 20, Issue. 5, p. 1556.

Statham, P Sagar, J Holland, J Pinard, P and Lozano-Perez, S. 2018. A convenient method for X-ray analysis in TEM that measures mass thickness and composition. IOP Conference Series: Materials Science and Engineering, Vol. 304, Issue. , p. 012017.

Pinard, P T Protheroe, A Holland, J Burgess, S and Statham, P J 2020. Development and validation of standardless and standards-based X-ray microanalysis. IOP Conference Series: Materials Science and Engineering, Vol. 891, Issue. 1, p. 012020.

Pinard, Philippe Burgess, Simon Protheroe, Alan Jones, Rosie and Statham, Peter 2020. Practical Aspects for Reliable Standardless Quantification in Energy Dispersive X-ray Spectrometry. Microscopy and Microanalysis, Vol. 26, Issue. S2, p. 1554.

Llovet, Xavier Moy, Aurélien Pinard, Philippe T. and Fournelle, John H. 2021. Electron probe microanalysis: A review of recent developments and applications in materials science and engineering. Progress in Materials Science, Vol. 116, Issue. , p. 100673.

Llovet, Xavier Moy, Aurélien Pinard, Philippe T. and Fournelle, John H. 2021. Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering. Progress in Materials Science, Vol. 120, Issue. , p. 100818.

Procop, Mathias and Terborg, Ralf 2022. Measurement and Calculation of X-Ray Production Efficiencies for Copper, Zirconium, and Tungsten. Microscopy and Microanalysis, Vol. 28, Issue. 6, p. 1865.

Pinard, Philippe T Burgess, Simon Zhang, John Qing and Statham, Peter J 2024. Characterization and Customization of Individual EDS Detectors to Improve X-ray Microanalysis of Light Elements. Microscopy and Microanalysis, Vol. 30, Issue. Supplement_1,

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Prospects for Single Standard Quantitative Analysis with SDD

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