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Volume 15 - Supplement S2 - July 2009

Contents

Page 1 of 39

Instrumentation and Techniques

Exhibitor Symposium: Making the Nano-Future Real: Instruments and Techniques that are Impacting Todays Research for Tomorrows Breakthroughs

Abstract

  • Cryoplunge™3 and Solarus® 950: a Perfect Duet for High Quality Frozen Hydrated Specimen Preparations for CryoEM,

  • L Melanson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 2-3
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Application of Low Accelerating Voltage Aberration Corrected Dedicated STEM With Cold FEG.

  • M Konno, Y Suzuki, K Nakamura, H Inada
  • Published online by Cambridge University Press:
    26 July 2009, pp. 4-5
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

David B. Wittry Memorial Symposium on Advances in Detectors in Microscopy and Microanalysis, Related Techniques, and Their Applications

Abstract

  • Measuring Trace Level Constituents with SEM/SDD-EDS

  • DE Newbury, N Ritchie
  • Published online by Cambridge University Press:
    26 July 2009, pp. 6-7
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Quantitative Atom-Probe Tomography

Abstract

  • Tomographic Reconstruction in Atom Probe Microscopy: Past, Present. . . Future?

  • B Gault, M Moody, EA Marquis, F de Geuser, BP Geiser, DJ Larson, TF Kelly, SP Ringer, GDW Smith
  • Published online by Cambridge University Press:
    26 July 2009, pp. 10-11
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Practical Determination of Spatial Resolution in Atom Probe Tomography

  • TF Kelly, E Voelkl, BP Geiser
  • Published online by Cambridge University Press:
    26 July 2009, pp. 12-13
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Atom Probe Tomographys of Magnesium Alloys

  • K Oh-ishi, T Ohkubo, K Hono
  • Published online by Cambridge University Press:
    26 July 2009, pp. 14-15
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Abstract

  • Glomerular Changes in Rats Administered ABT-869, a Multitargeted Receptor Tyrosine Kinase Inhibitor - Linking Ultrastructure to Mechanism

  • J Fagerland, S Morgan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 16-17
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Sticking Residue on Tablet Punch Faces by Scanning Electron Microscopy and X-Ray Mapping

  • J Neilly, A Vogt, W Dziki
  • Published online by Cambridge University Press:
    26 July 2009, pp. 18-19
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Advances in Fluorescent Nanoprobes for Cellular and In Vivo Imaging

Abstract

Metals and Minerals and Microstructure: Applications and Advances of Electron Backscatter Diffraction (EBSD)

Abstract

  • Analysis of Complex HSLA Steel Microstructures by Various Techniques

  • M Merwin, C Becker, D Giansante
  • Published online by Cambridge University Press:
    26 July 2009, pp. 22-23
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Failure Analyses: Practical Metallography/Fractography in Case Studies

Abstract

  • Thermal Fatigue and Failure Analysis of Cu-Plated Through Hole Solder Joints

  • DF Susan, AC Kilgo, PT Vianco, MK Neilsen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 26-27
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Effects of Lightning Strikes and High Current on Aerospace Materials

  • LM Gammon, N Baxter, CA Meyr, H Oberson, ER Stack, A Falcone
  • Published online by Cambridge University Press:
    26 July 2009, pp. 28-29
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Problem Solving Using Microanalysis in the Real World

Abstract

  • Artifacts in Qualititative and Quantitative X-Ray Mapping

  • R Wuhrer, K Moran
  • Published online by Cambridge University Press:
    26 July 2009, pp. 30-31
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Channeling Effects in EPMA Analyses of Bulk Specimen Materials

  • F Meisenkothen, R Wheeler, MD Uchic, R Kerns, F Scheltens
  • Published online by Cambridge University Press:
    26 July 2009, pp. 32-33
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Micro XRF Element Maps Are A New Method Of Detecting Elements At Lower Concentrations Than The Electron Beam Produced Corollary: A Garnet Schist Example

  • C Schwandt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 34-35
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Breaking the Light Barrier: Overcoming Diffraction-Limited Microscopy

Abstract

  • Three-Dimensional Super-resolution Imaging of Thick Biological Samples

  • A Vaziri, J Tang, H Shroff, C Shank
  • Published online by Cambridge University Press:
    26 July 2009, pp. 36-37
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Three-Dimensional Imaging in the Biological and Materials Sciences: Bridging Nano and Micron Scales

Abstract

  • 3 Dimensional Correlated Microscopy of Fluorescence Microscopy and Serial Block Face SEM

  • J Mancuso, JL Serrano-Velez, II Torres-Vazquez, E Rosa-Molinar
  • Published online by Cambridge University Press:
    26 July 2009, pp. 38-39
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Developments in Techniques and Algorithms for Materials-Based Electron Tomography

  • PA Midgley, J Tong, I Arslan, J-C Hernandez
  • Published online by Cambridge University Press:
    26 July 2009, pp. 40-41
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 1 of 39