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Introduction: A Special Issue on Electron Diffraction
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- 16 September 2003, pp. 377-378
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Quantitative Convergent Beam Electron Diffraction Measurements of Low-Order Structure Factors in Copper
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- 16 September 2003, pp. 379-389
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Analysis of Local Strain in Aluminum Interconnects by Convergent Beam Electron Diffraction
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- 16 September 2003, pp. 390-398
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Sufficient Conditions for Direct Methods with Swift Electrons
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- 16 September 2003, pp. 399-410
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Quantitative Zone-Axis Convergent Beam Electron Diffraction: Current Status and Future Prospects
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- 16 September 2003, pp. 411-418
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A Combination Method of Charge Density Measurement in Hard Materials Using Accurate, Quantitative Electron and X-ray Diffraction: The α-Al2O3 Case
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- 16 September 2003, pp. 419-427
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Low-Dose, Low-Temperature Convergent-Beam Electron Diffraction and Multiwavelength Analysis of Hydrocarbon Films by Electron Diffraction
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- 16 September 2003, pp. 428-441
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Accurate Measurements of Valence Electron Distribution and Interfacial Lattice Displacement Using Quantitative Electron Diffraction
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- 16 September 2003, pp. 442-456
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On the Consistency of QCBED Structure Factor Measurements for TiO2 (Rutile)
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- 16 September 2003, pp. 457-467
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A Quantitative Nanodiffraction System for Ultrahigh Vacuum Scanning Transmission Electron Microscopy
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- 16 September 2003, pp. 468-474
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Quantitative Electron Diffraction Evidence for One-Dimensional Ordering in Magnetite above the Verwey Transition
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- 16 September 2003, pp. 475-483
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Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9
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- 16 September 2003, p. 484
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