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Sufficient Conditions for Direct Methods with Swift Electrons

Published online by Cambridge University Press:  16 September 2003

L.D. Marks  and
W. Sinkler
L.D. Marks
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60201, USA
W. Sinkler
Affiliation:
UOP LLC, 25 E. Algonquin Rd., Des Plaines, IL 60017-5017, USA
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Abstract

We investigate cases where one can argue that sufficient conditions exist for Direct Methods to work with swift electrons. In addition to simple cases where kinematical scattering holds (e.g., surfaces in plan view), we identify three other configurations: (a) when 1s channeling holds and kinematical scattering is statistically correct; (b) when there is a mapping from kinematical to dynamical intensities that preserves the order of the intensities, for instance with powder or precession data, and (c) when the scattering is dominated by one type of atom. We also briefly discuss the possibility of using Direct Methods to restore the complex exit wave leaving a sample in the most general case.

Keywords

diffractiondirect methodsprecessionstructure solution
Type
Research Article
Information
Microscopy and Microanalysis , Volume 9 , Issue 5 , October 2003 , pp. 399 - 410
Copyright
© 2003 Microscopy Society of America

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