Proceedings of Microscopy & Microanalysis 2016
Analytical and Instrumentation Science Symposia
Applications of Correlative Microscopy to Physical and Biological Sciences
Abstract
Correlative NanoSIMS and Atom Probe Study of Nacre: Toward Understanding Polymorphism Effects in a Chinese Pearl
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 242-243
-
- Article
-
- You have access
- Export citation
Advancements in Interfaced SEM and Raman Spectromicroscopy (μRS)
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 244-245
-
- Article
-
- You have access
- Export citation
Correlative Light and Electron Microscopy (CLEM) Utilizing Hitachi HILEMTMIL1000 Ionic Liquid
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 246-247
-
- Article
-
- You have access
- Export citation
A New Solution of Non-integrated Correlative Light and Electron Microscopy Based on High-vacuum Optical Platform
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 248-249
-
- Article
-
- You have access
- Export citation
Morphology and Composition of Biomineralized Ceria and Ceria-Zirconia Nanocrystals
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 250-251
-
- Article
-
- You have access
- Export citation
Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis
Abstract
Fast Aberration Measurement in Multi-Dimensional STEM
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 252-253
-
- Article
-
- You have access
- Export citation
Application of High Speed Cameras for 4D Data Collection in S/TEM
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 254-255
-
- Article
-
- You have access
- Export citation
Electric and Magnetic Field Mapping With the pnCCD (S)TEM Camera
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 256-257
-
- Article
-
- You have access
- Export citation
Reverse Engineering Cadmium Yellow Paint from Munch’s “The Scream” with Correlative 3-D Spectroscopic and 4-D Crystallographic STEM
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 258-259
-
- Article
-
- You have access
- Export citation
Simultaneous DualEELS and EDS Analysis Across the Ohmic Contact Region in FinFET Electronic Devices - Exploring the Effects of Electron Beam Damage
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 260-261
-
- Article
-
- You have access
- Export citation
Detection of oxygen sub-lattice ordering in A-site deficient perovskites through monochromated core-loss EELS mapping
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 262-263
-
- Article
-
- You have access
- Export citation
Pseudo Atomic Column EELS & EDS Mapping of Silicon Reconstructed With K and L Electrons Using STEM-Moiré Method
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 264-265
-
- Article
-
- You have access
- Export citation
Unveiling Complex Plasmonic Resonances in Archimedean Nanospirals through Cathodoluminescence in a Scanning Transmission Electron Microscope
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 266-267
-
- Article
-
- You have access
- Export citation
Visualizing Interface Effects in Two-dimensionally Doped La2CuO4 and La2CuO4/ La2-xSrxNiO4 Superlattices
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 268-269
-
- Article
-
- You have access
- Export citation
Connecting Phase Stability to the Grain Growth Behavior of Ni-W Alloys
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 270-271
-
- Article
-
- You have access
- Export citation
Novel Characterization of Deformation Mechanisms in a Ni-base Superalloy Using HAADF Imaging and Atomic Ordering Analysis
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 272-273
-
- Article
-
- You have access
- Export citation
Spectral Electron Tomography as a Quantitative Technique to Investigate Functional Nanomaterials
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 274-275
-
- Article
-
- You have access
- Export citation
Automated 3D EDS Acquisition for Spatially Resolved Elemental Characterization of Catalyzed MgH2 Nanostructures
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 276-277
-
- Article
-
- You have access
- Export citation
Quantitative Measurements of the Penumbra of XEDS Systems in an AEM
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 278-279
-
- Article
-
- You have access
- Export citation
Characterization of VLSI Processing Defects Using STEM-EELS Tomography
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 280-281
-
- Article
-
- You have access
- Export citation