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Advancements in Interfaced SEM and Raman Spectromicroscopy (μRS)

Published online by Cambridge University Press:  25 July 2016

Sergey V. Prikhodko ,
Andrew King  and
Ioanna Kakoulli
Sergey V. Prikhodko
Affiliation:
Department of Materials Science and Engineering, UCLA, Los Angeles, CA
Andrew King
Affiliation:
Renishaw Inc. Spectroscopy Products Division, 5277 Trillium Blvd., Hoffman Estates, IL
Ioanna Kakoulli
Affiliation:
Department of Materials Science and Engineering, UCLA, Los Angeles, CA UCLA/Getty Conservation Program, Cotsen Institute of Archaeology, UCLA, Los Angeles, CA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 244 - 245
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Truchet, M & Delhaye, M J. Microsc. Spectrosc. Electron (1988) 13(2), 167–175.Google Scholar
[2] Sharma, B, et al, Materials Today (2012) 15, 16.Google Scholar
[3] Prikhodko, S.V, et al, J Raman Spectrosc 46 (2015) 632–635.Google Scholar