Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

STEM Investigations of Defects and Interfaces In Complex Oxides

A Challenging to Characterization of Superconductors: Accurate Measurements of Charge Distribution and Interfacial Displacement

High-Resolution and Low Temperature Tem Study of Superconducting Cuprates and CMR-Manganites

In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials

Crystal Structure Determination of Superconductors and Related Compounds by Combining High-Resolution Electron Microscopy and Electron Diffraction

Exploring the Surface of Pb-doped Manganese Perovskite

Mössbauer Studies of Fe-doped La-Ca-Mn-O Colossal Magnetoresistive Perovskites

Domain Structure of Magnetic Nanocrystalline Materials Studied by Electron Holography

Quantum Well Interference and Exchange Coupling in Double Quantum Well Thin Films

Solving the Structural Mysteries of Magnetic Materials in TEM

Progress Towards More Realistic In-Situ Microscopy Observations

In-situ Observation of Alloy Phase Formation in Isolated Nanometer-sized Particles

High Resolution In-situ SEM of Competitive Particle Sintering and Other Surface Processes

Real Time Uhv-Hrtem Observation Of Si(111)√3x√3-Pd Surface And Dynamic Motion Of Pd Clusters

In situ Molecular Imaging of Heterogeneous Catalytic Processes in Liquid Environments

In-situ UHV-Electron Microscopy with Scanning Tunneling Microscope

In Situ HREM of Crystallization Reactions

Aberration Correction for Analytical In Situ TEM – the NTEAM Concept.

In situ Transmission Electron Microscopy of Copper Electrodeposition

Local Measurement of Reaction Kinetics Using in situ Transmission Electron Microscopy

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract