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In situ Transmission Electron Microscopy of Copper Electrodeposition

Published online by Cambridge University Press:  01 August 2002

F. M. Ross ,
M. J. Williamson ,
R. M. Tromp ,
R. Hull  and
P. M. Vereecken
F. M. Ross
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598
M. J. Williamson
Affiliation:
School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22903
R. M. Tromp
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598
R. Hull
Affiliation:
School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22903
P. M. Vereecken
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 420 - 421
Copyright
Copyright © Microscopy Society of America 2002