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In-situ UHV-Electron Microscopy with Scanning Tunneling Microscope

Published online by Cambridge University Press:  01 August 2002

K. Takayanagi ,
Y. Ohshima ,
K. Mohri ,
Y. Naitoh ,
H. Hirayama ,
Y. Tanishiro  and
Y. Kondo
K. Takayanagi
Affiliation:
Tokyo Institute of Technology, Physics Department, Tokyo, 152-8551, Japan
Y. Ohshima
Affiliation:
Tokyo Institute of Technology, Material Science and Eng. Dept., Yokohama, 226-8502, Japan
K. Mohri
Affiliation:
Tokyo Institute of Technology, Material Science and Eng. Dept., Yokohama, 226-8502, Japan
Y. Naitoh
Affiliation:
Tokyo Institute of Technology, Material Science and Eng. Dept., Yokohama, 226-8502, Japan
H. Hirayama
Affiliation:
Tokyo Institute of Technology, Material Science and Eng. Dept., Yokohama, 226-8502, Japan
Y. Tanishiro
Affiliation:
Tokyo Institute of Technology, Physics Department, Tokyo, 152-8551, Japan
Y. Kondo
Affiliation:
JEOL LTD, EMG Electron Optics Division, Tokyo, 196-8558, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 414 - 415
Copyright
Copyright © Microscopy Society of America 2002