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SEMS and MAPS: recent developments in microstructure mapping

Published online by Cambridge University Press:  17 November 2003

J. Driver
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Abstract

Recent developments in Scanning Electron Microscopy (SEM) are reviewed paying particular attention to the modern tendency to determine quantitative data in the form of microstructure maps : of chemical composition (EDS and WDS), of crystal orientation (EBSD) and of the deformation (microextensometry). The maps are then used to provide complete, quantitative microstructural analyses in terms of the size, orientation and composition distributions. In this context the new SEM-FEGs have an important role to play.

Type
Research Article
Information
Metallurgical Research & Technology , Volume 100 , Issue 5: Science et Génie des MatériauxMatériaux et microscopies , May 2003 , pp. 551 - 559
Copyright
© La Revue de Métallurgie, 2003

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