Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-27T06:37:39.489Z Has data issue: false hasContentIssue false
  • English
  • Français

Measurement of deformation at the atomic scale by high-resolution electron microscopy

Published online by Cambridge University Press:  27 March 2003

M. J. Hÿtch
Get access

Abstract

A quantitative method is described for the measurememnt of displacements and strains by high-resolution electron microscopy. The image is considered to be composed of periodic sets characterized by Fourier analysis. The local amplitude and geometric phase of lattice fringes can be determined in this way. The analysis of the phase distribution leads to the determination of the local lattice configuration. The method is illustrated by different examples and its application conditions are discussed.

Type
Research Article
Information
Metallurgical Research & Technology , Volume 100 , Issue 2: Science et Génie des MatériauxJournée Jean Morlet : J.A. SF2M 2001 , February 2003 , pp. 211 - 222
Copyright
© La Revue de Métallurgie, 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)