Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-28T00:01:49.335Z Has data issue: false hasContentIssue false
  • English
  • Français

High resolution crystal orientation measurement techniques for the study of nucleation processes during recrystallization in heavily deformed metals

Published online by Cambridge University Press:  17 November 2003

S. Zaefferer
Get access

Abstract

This article presents and discusses some modern techniques for high resolution orientation measurements in electron microscopy, including electron backscatter diffraction (EBSD) in the scanning electron microscope and spot and Kikuchi diffraction as well as dark field conical scanning in the transmission electron microscope. The techniques are compared with respect to their applicability to studies of nucleation processes during recrystallization of highly deformed metals. These investigations make high demands on orientation measurements, as high spatial and angular resolution and insensitivity to lattice defects are required.

Type
Research Article
Information
Metallurgical Research & Technology , Volume 100 , Issue 9: Science et Génie des MatériauxHétérogénéités de déformation , September 2003 , pp. 891 - 901
Copyright
© La Revue de Métallurgie, 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)