Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-27T06:07:13.734Z Has data issue: false hasContentIssue false

Contributions of environmental scanning electron microscopy to the characterization of metallic materials

Published online by Cambridge University Press:  17 November 2003

Get access

Abstract

Since its introduction in the early eighties, Environmental Scanning Electron Microscopy (ESEM) proved a particularly useful tool in the characterisation of delicate samples mainly in the field of life sciences. Now, the potential of this equipment (no or little sample preparation, possible dynamic observation and reactivity studies...) is more and more employed in traditional materials domains. Some typical applications of ESEM concerning metallic compounds are presented.

Type
Research Article
Copyright
© La Revue de Métallurgie, 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)