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AFM, TEM and nanoindentation characterizations of plastic deformation in metallic multilayers

Published online by Cambridge University Press:  17 November 2003

M. Verdier
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Abstract

This communication presents experimental observations of plastic deformation in submicronic metallic multilayers. As the length scale decreases down to the nanometer range, we evidence a major change in deformation mechanisms, plasticity becoming less localized as in traditional slip bands of dislocations. AFM and nanoindentation techniques are used in conjonction with more standard techniques to characterize plastic deformation.

Type
Research Article
Information
Metallurgical Research & Technology , Volume 100 , Issue 5: Science et Génie des MatériauxMatériaux et microscopies , May 2003 , pp. 535 - 540
Copyright
© La Revue de Métallurgie, 2003

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