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Significance of time-of-flight ion energy spectrum on energy deposition into matter by high-intensity pulsed ion beam

Published online by Cambridge University Press:  14 July 2010

J.P. Xin ,
X.P. Zhu  and
M.K. Lei
J.P. Xin
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering, Dalian University of Technology, Dalian, China
X.P. Zhu
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering, Dalian University of Technology, Dalian, China
M.K. Lei*
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering, Dalian University of Technology, Dalian, China
*
Address correspondence and reprint requests to: M.K. Lei, Surface Engineering Laboratory, School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024, China. E-mail: [email protected]
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Abstract

Energy deposition by high-intensity pulsed ion beam into a metal target has been studied with time-of-flight (TOF) of ions which can be related to the original ion kinetic energy E0 and the ion mass with . It is found that the TOF effect has a profound influence on the kinetic energy distribution of implanted ions and subsequent energy deposition process into the target. The HIPIB of mixed H+ and C+ was extracted from a magnetically insulated ion diode at a peak accelerating voltage of 350 kV, leading to an ion current density of 300 A/cm2 at the target. The widespread ion energy spectrum remarkably varied in shape as arriving at the target surface, from the original Gaussian-like of 80-ns duration to a pulse form of a sharp front and a long tail extending to about 140-ns duration. Energy loss of the mixed ions into a Ti target was simulated utilizing a Monte Carlo method. The energy deposition generally showed a shallowing trend and could be divided into two phases proceeded with sequent arrivals of H+ and C+. Note that, the peak value of deposited energy profile appeared at the beginning of mixed ion irradiation phase, other than the phase of firstly arrived H+ with peak kinetic energy and peak ion current. This study indicated that TOF effect of ions greatly affects the HIPIB-matter interaction with a kinetic energy spectrum of impinging ions at the target, noticeably differing from that of original output of the ion source; consequently, the specific energy deposition phenomena of the widespread ion energy can be studied with the TOF correlation of ion energy and ion current, otherwise not obtainable in common cases assuming fixed ion energy distribution in accordance with the original source output.

Keywords

High-intensity pulsed ion beamIrradiationEnergy depositionTime-of-flight effect
Type
Research Article
Information
Laser and Particle Beams , Volume 28 , Issue 3 , September 2010 , pp. 429 - 436
Copyright
Copyright © Cambridge University Press 2010

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References

REFERENCES

Akamatsu, H., Ikeda, T., Azuma, K., Fujiwara, E. & Yatsuzuka, M. (2001). Surface treatment of steel by short pulsed injection of high-power ion beam. Surf. Coat. Technol. 136, 269–272.CrossRefGoogle Scholar
Bystritskii, V., Garate, E., Rostoker, N., Song, Y., Vandrie, A., Anderson, M., Qerushi, A., Dettrick, S., Binderbauer, M., Walters, J.K., Matvienko, V., Petrov, A., Shlapakovsky, A., Polkovnikova, N. & Isakov, I. (2004). Generation and transport of a low energy intense ion beam. J. Appl. Phys. 96, 1249–1256.CrossRefGoogle Scholar
Davis, H.A., Johnston, G.P., Olson, J.C., Rej, D.J., Waganaar, W.J., Ruiz, C.L., Schmidlapp, F.A. & Thompson, M.O. (1999). Characterization and modelling of the ablation plumes formed by intense-pulsed ion beam impact on solid targets. J. Appl. Phys. 85, 713–721.Google Scholar
Isakov, I.F., Kolodii, V.N., Opekunov, M.S., Matvienko, V.M., Pechenkin, S.A., Remnev, G.E. & Usov, Yu.P. (1991). Sources of high power ion beams for technological applications. Vac. 42, 159–162.CrossRefGoogle Scholar
Ito, H., Miyake, H. & Masugata, K. (2008). Diagnosis of high-intensity pulsed heavy ion beam generated by a novel magnetically insulated diode with gas puff plasma gun. Rev. Sci. Instrum. 79, 103502.CrossRefGoogle ScholarPubMed
Krasa, J., Velyhan, A., Jungwirth, K., Krousky, F., Laska, L., Rohlena, K., Pfeifer, M. & Ullschmied, J. (2009). Repetitive outbursts of fast carbon and fluorine ions from sub-nanosecond laser-produced plasma. Laser Part. Beams 27, 171–178.CrossRefGoogle Scholar
Le, X.Y., Yan, S., Zhao, W.J., Han, B.X., Wang, Y.G. & Xue, J.M. (2000). Computer simulation of thermal-mechanical effects of high intensity pulsed ion beams on a metal surface. Surf. Coat. Technol. 128–129, 381–386.Google Scholar
Li, L.M., Liu, L., Cheng, G.X., Xu, Q.F., Ge, X.J. & Wen, J.C. (2009). Layer structure, plasma jet, and thermal dynamics of Cu target irradiated by relativistic pulsed electron beam. Laser Part. Beams 27, 497–509.CrossRefGoogle Scholar
Linke, J., Escourbiac, F., Mazul, I.V., Nygren, R., Rodig, M., Schlosser, J. & Suzuki, S. (2007). High heat flux testing of plasma facing materials and components — Status and perspectives for ITER related activities. J. Nucl. Mater. 367–370, 1422–1431.CrossRefGoogle Scholar
Noonan, W.A., Glidden, S.C., Greenly, J.B. & Hammer, D.A. (1995). Design and operation of a high pulse rate intense ion beam diode. Rev. Sci. Instrum. 66, 3448–3458.CrossRefGoogle Scholar
Pogrebnjak, A.D., Shablya, V.T., Sviridenko, N.V., Valyaev, A.N., Plotnikov, S.V. & Kylyshkanov, M.K. (1999). Study of deformation states in metals exposed to intense-pulsed-ion beams (IPIB). Surf. Coat. Technol. 111, 46–50.Google Scholar
Rej, D.J., Davis, H.A., Olson, J.C., Remnev, G.E., Zakoutaev, A.N., Ryzhkov, V.A., Struts, V.K., Isakov, I.F., Shulov, V.A., Nochevnaya, N.A., Stinnett, R.W., Neau, E.L., Yatsui, K. & Jiang, W. (1997). Materials processing with intense pulsed ion beams. J. Vac. Sci. Technol. A 15, 1089–1097.Google Scholar
Remnev, G.E., Isakov, I.F., Opekounov, M.S., Kotlyarevsky, G.I., Kutuzov, V.L., Lopatin, V.S., Matvienko, V.M., Ovsyannikov, M.Yu., Potyomkin, A.V. & Tarbokov, V.A. (1997). High-power ion beam sources for industrial application. Surf. Coat. Technol. 96, 103–109.CrossRefGoogle Scholar
Remnev, G.E., Isakov, I.F., Opekounov, M.S., Matvienko, V.M., Ryzhkov, V.A., Struts, V.K., Grushin, I.I., Zakoutayev, A.N., Potyomkin, A.V., Tarbokov, V.A., Pushkaryov, A.N., Kutuzov, V.L. & Ovsyannikov, M.Yu. (1999). High intensity pulsed ion beam sources and their industrial applications. Surf. Coat. Technol. 114, 206–212.Google Scholar
Renk, T.J., Mann, G.A. & Torres, G.A. (2008). Performance of a pulsed ion beam with a renewable cryogenically cooled ion source. Laser Part. Beams 26, 545–554.Google Scholar
Renk, T.J., Provencio, P.P., Prasad, S.V., Shlapakovski, A.S., Petrov, A.V., Yatsui, K., Jiang, W. & Suematsu, H. (2004). Materials modification using intense ion beams. Proc. IEEE. 92, 1057–1081.CrossRefGoogle Scholar
Stasic, J., Gakovic, B., Krmpot, A., Pavlovic, V., Trtica, M. & Jelenkovic, B. (2009). Nickel-based super-alloy Inconel 600 morphological modifications by high repetition rate femtosecond Ti:sapphire laser. Laser Part. Beams 27, 699–707.CrossRefGoogle Scholar
Tahir, N.A., Hoffmann, D.H.H., Kozyreva, A., Shutov, A., Maruhn, J.A., Neuner, U., Tauschwitz, A., Spiller, P. & Bock, R. (2000). Shock compression of condensed matter using intense beams of energetic heavy ions. Phys. Rev. E 61, 1975–1980.Google Scholar
Trtica, M.S., Radak, B.B., Gakovic, B.M., Milovanovic, D.S., Batani, D. & Desai, T. (2009). Surface modifications of Ti6A14V by a picosecond Nd:YAG laser. Laser Part. Beams 27, 85–90.Google Scholar
Wu, D., Liu, C., Zhu, X.P. & Lei, M.K. (2008). Research on ZrO2 thermal barrier coatings modified by high-intensity pulsed ion beam. Chin. Phys. Lett. 25, 1266–1269.Google Scholar
Zhu, X.P., Lei, M.K., Dong, Z.H. & Ma, T.C. (2003). Characterization of a high-intensity unipolar-mode pulsed ion source with improved magnetically insulated diode. Rev. Sci. Instrum. 74, 47–52.Google Scholar
Ziegler, J.F., Biersack, J.P. & Littmark, U. (1996). The Stopping and Range of Ions in Solids. New York: Pergamon.Google Scholar