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High-intensity pulsed ion beam focusing by its own space charge

Published online by Cambridge University Press:  15 February 2019

X.P. Zhu ,
Q. Zhang ,
L. Ding ,
C.C. Zhang ,
Yu. Isakova Open the ORCID record for Yu. Isakova [Opens in a new window] ,
A. Prima ,
A. Pushkarev  and
M.K. Lei
X.P. Zhu
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
Q. Zhang
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
L. Ding
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
C.C. Zhang
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
Yu. Isakova
Affiliation:
Tomsk Polytechnic University, 30, Lenin Ave, 634050 Tomsk, Russia
A. Prima
Affiliation:
Tomsk Polytechnic University, 30, Lenin Ave, 634050 Tomsk, Russia
A. Pushkarev
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China Tomsk Polytechnic University, 30, Lenin Ave, 634050 Tomsk, Russia
M.K. Lei*
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
*
Author for correspondence: Yu. Isakova, Tomsk Polytechnic University, 30, Lenin Ave, 634050 Tomsk, Russia. E-mail: [email protected]
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Abstract

The paper presents the results of a study on propagation and focusing of high-intensity pulsed ion beams, produced by a self-magnetically insulated diode of semi-cylindrical geometry at the TEMP-6 accelerator (120 ns, 200–250 kV). We examined the space-charge neutralization of the beam, the energy density in the focus, the divergence of the beam, and its shot-to-shot displacement in the focal plane. It is found that the concentration of low-energy electrons in the beam is 1.3–1.5 times higher than the concentration of ions. We observed additional ion focusing by its own space charge. With an increase in the density of the net negative (electrons and ions) charge of the beam from 3.6 to 9 µC/cm2, the total divergence (the sum of the beam divergence in the vertical and horizontal planes) decreases from 11.4 to 4.5°. It leads to an increase in the energy density in the focus from 4 up to 10–12 J/cm2. To increase the electrons concentration in the beam, a metal grid installed in the ion beam transport region was used.

Keywords

Beam displacementbeam divergenceenergy densityfocusingpulsed neutralized ion beamspace chargestatistical analysis of the ion beam parameters
Type
Research Article
Information
Laser and Particle Beams , Volume 36 , Issue 4 , December 2018 , pp. 470 - 476
Copyright
Copyright © Cambridge University Press 2019 

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