Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-03T08:16:59.148Z Has data issue: false hasContentIssue false

Treatment of edge beams in a focusing self-magnetically Bθ-insulated ion diode

Published online by Cambridge University Press:  09 March 2009

Thomas Westermann
Affiliation:
Kernforschungszentrum Karlsruhe GmbH Hauptabteilung f¨r Daten- und Informationsverarbeitung
Walter Bauer
Affiliation:
Kernforschungszentrum Karlsruhe GmbH lnstitut f¨r Neutronenphysik und Reaktortechnik, Postfach 3640, 7500 Karlsruhe, Federal Republic of Germany

Abstract

When focusing light ions with intense light ion-beam diodes, problems occur with ions emitted at the edge of the anode plasma. Numerical studies investigating this well-known experimental observation are presented. Going beyond the computational simulations introduced by Westermann (1991 Appl. Phys. Lett. 58, 696), two suggestions for the case of the self-magnetically Bθ-insulated ion diode are presented to focus the beamlets emitted from outer parts of the anode. The first one is based upon the idea of changing nonemitting parts of the anode surface and the second one of shifting the emitting anode surface into the anode body.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Bauer, W. et al. 1990 Proceedings of the 8th International Conference on High-Power Particle Beams, Novosibirsk(World Scientific,Singapore), p. 457.Google Scholar
Child, C. D. 1911 Phys. Rev. 32, 492.Google Scholar
Cook, C. et al. 1988 Proceedings of the 7th International Conference on High-Power Particle Beams, Karlsruhe, p. 35.Google Scholar
Cooperstein, G. et al. 1981 Laser Interaction and Related Plasma Phenomena (Plenum Press, New York), Vol. 5, pp. 105134.Google Scholar
Humphries, S. Jr., 1980 Nucl. Fusion 20, 1549.CrossRefGoogle Scholar
Mehlhorn, T.A. et al. 1988 Rev. Sci. Instrum. 59, 1709.CrossRefGoogle Scholar
Pierce, J.R. 1940 J. Appl. Phys. 11, 548.CrossRefGoogle Scholar
Poukey, J.W. et al. 1975 Phys. Rev. Lett. 35, 1806.CrossRefGoogle Scholar
Quintenz, J.P. et al. 1985 Bull. Am. Phys. Soc. 30, 1603.Google Scholar
Schimassek, W. & Westermann, T. 1989 Laser Part. Beams 7, 675.Google Scholar
Schimassek, W. et al. 1991 Rev. Sci. Instrum. 62, 168.CrossRefGoogle Scholar
Westermann, T. 1988 Nucl. Instrum. Meth. A 263, 271.CrossRefGoogle Scholar
Westermann, T. 1989 Nucl. Instrum. Meth. A 281, 253.CrossRefGoogle Scholar
Westermann, T. 1991 Appl. Phys. Lett. 58, 696.CrossRefGoogle Scholar
Vandevender, J.P. & Cook, D.L. 1986 Science 232, 831.CrossRefGoogle Scholar
Zieher, K.W. & Stoltz, O. 1981 Proceedings of the 4th International Topical Conference on High-Power Electron and Ion-Beam Research and Technology,Palaiseau p. 379.Google Scholar
Zieher, K.W. 1984 Nucl. Instrum. Meth. A 228, 161.CrossRefGoogle Scholar