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Three-dimensional, tight focusing of intense pulsed light-ion beam by spherical plasma focus diode

Published online by Cambridge University Press:  09 March 2009

Weihua Jiang ,
Toshiya Sakagami ,
Katsumi Masugata  and
Kiyoshi Yatsui
Weihua Jiang
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
Toshiya Sakagami
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
Katsumi Masugata
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
Kiyoshi Yatsui
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
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Abstract

A new type of ion-beam diode, self-magnetically insulated, spherical plasma focus diode (SPFD), was developed. With the SPFD, three-dimensional focusing of an intense pulsed light-ion beam was obtained. Experiments and simulations were carried out to study the behavior of the SPFD. In the experiments, diagnostic results of the Rutherford scattering pinhole camera and the shadow-box showed that the ion beam was focused into a small cylindrical area with ∽0.5 mm in diameter and ∽2.5 mm in length. The average ion-beam current density at the anode surface was found to be ∽2 kA/cm2. In the simulations, it was observed that most of the diode gap is well insulated by the self-magnetic field induced by the diode current. The electron sheath in the diode gap significantly enhances the ion flow from the anode. As a result, the ion current density is several times higher than the single-species space-charge limited value.

Type
Research Article
Information
Laser and Particle Beams , Volume 13 , Issue 2 , June 1995 , pp. 343 - 350
Copyright
Copyright © Cambridge University Press 1995

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References

REFERENCES

Dreike, P.L. et al. 1986 J. Appl. Phys. 60, 878.CrossRefGoogle Scholar
Jiang, W. et al. 1992a Laser Part. Beams 10, 53.CrossRefGoogle Scholar
Jiang, W. et al. 1992b Proc. 9th Int. Conf. High-Power Particle Beams, Mosher, D. & Cooperstein, G., eds. (Washington, D.C.), p. 859.Google Scholar
Jiang, W. et al. 1993 Jpn. J. Appl. Phys. 32, L752.CrossRefGoogle Scholar
Jiang, W. et al. 1995 Physics of Plasmas 1, 325.CrossRefGoogle Scholar
Masugata, K. et al. 1989 Laser Part. Beams 7, 287.CrossRefGoogle Scholar
Yatsui, K. et al. 1986 Proc. 6th Int. Conf. High-Power Particle Beams, Yamanaka, C., ed. (Osaka Univ., Osaka), p. 329.Google Scholar
Yatsui, K. et al. 1987 Proc. 11th Int. Conf. Plasma Phys. & Controlled Nuclear Fusion Res. IAEA 3, p. 177.Google Scholar
Yatsui, K. et al. 1990 Proc. 8th Int. Conf. High-Power Particle Beams, Breizman, B.N. & Knyazev, B.A., eds. (World Scientific, Novosibirsk, USSR I), p. 535.Google Scholar