Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-30T15:34:35.998Z Has data issue: false hasContentIssue false
  • English
  • Français

Soft X-ray lasing at 519.7 Å in a Recombining Z-pinch Plasma

Published online by Cambridge University Press:  09 March 2009

E. Eberl ,
T. Wagner ,
J. Jacoby ,
A. Tauschwitz  and
D.H.H. Hoffmann
E. Eberl
Affiliation:
Physikalisches Institut I, Universität Erlangen-Nürnberg, 91058 Erlangen, Germany
T. Wagner
Affiliation:
Physikalisches Institut I, Universität Erlangen-Nürnberg, 91058 Erlangen, Germany
J. Jacoby
Affiliation:
Physikalisches Institut I, Universität Erlangen-Nürnberg, 91058 Erlangen, Germany
A. Tauschwitz
Affiliation:
Physikalisches Institut I, Universität Erlangen-Nürnberg, 91058 Erlangen, Germany
D.H.H. Hoffmann
Affiliation:
Physikalisches Institut I, Universität Erlangen-Nürnberg, 91058 Erlangen, Germany
Get access Rights & Permissions [Opens in a new window]

Abstract

This paper is reviewing the amplification of XUV radiation at 519.7 and 498.5 Å with a gain-length product of 2.5 and 2.2 for the 4f-3d and 4d-3p transition in an oxygen Z-pinch plasma. Time resolved measurements of the O VI (519.7 Å) transition were performed and the dependence of the line intensity on the discharge current and initial gas pressure is reported.

Type
Research Article
Information
Laser and Particle Beams , Volume 15 , Issue 4 , December 1997 , pp. 589 - 595
Copyright
Copyright © Cambridge University Press 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Da Silva, L.B. et al. 1995 Phys. Rev. Lett. 74, 3991.Google Scholar
Elton, R.C. 1990 X-Ray Lasers (Academic, Boston).Google Scholar
Hartmann, W. et al. 1991 Appl. Phys. Lett. 58, 2619.Google Scholar
Linford, G.J. et al. 1974 Appl. Optics 13, 379.CrossRefGoogle Scholar
London, R. et al. 1992 San Francisco, CA, Conf. Applications of X-Ray Lasers (Springfield, VA, National Technical Information Science, U.S. Department of Commerce).Google Scholar
Matthews, D.L. et al. 1985 Phys. Rev. Lett. 54, 110.CrossRefGoogle Scholar
Rocca, J.J. et al. 1988 Opt. Lett. 13, 565.Google Scholar
Rocca, J.J. et al. 1994 Phys. Rev. Lett. 73, 2192.CrossRefGoogle Scholar
Shin, H.-J. et al. 1994 Phys. Rev. E 50, 1376.Google Scholar
Skinner, C.H. 1991 Phys. Fluids B3, 2420.CrossRefGoogle Scholar
Steden, C. & Kunze, H.-J. 1990 Phys. Lett. A 151, 534.Google Scholar
Suckewer, S. et al. 1985 Phys. Rev. Lett. 55, 1753.CrossRefGoogle Scholar
Wagner, T. et al. 1996 Phys. Rev. Lett. 22, 3124.CrossRefGoogle Scholar