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Laser-Compton scattering as a tool for electron beam diagnostics

Published online by Cambridge University Press:  21 September 2006

K. CHOUFFANI
Affiliation:
Idaho Accelerator Center, Pocatello, Idaho
F. HARMON
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho
D. WELLS
Affiliation:
Idaho Accelerator Center, Pocatello, Idaho
J. JONES
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho
G. LANCASTER
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho

Abstract

Laser-Compton scattering (LCS) experiments were carried out at the Idaho Accelerator Center (ICA) using the 5 ns (FWHM) and 22 MeV electron beam. The electron beam was brought to an approximate head-on collision with a 7 ns (FWHM), 10 Hz, 29 MW peak power Nd:YAG laser. We observed clear and narrow X-ray peaks resulting from the interaction of relativistic electrons with the 532 nm Nd:YAG laser second harmonic line on top of a very low bremsstrahlung background. We have developed a method of using LCS as a non-intercepting electron beam monitor. Unlike the method used by Leemans et al. (1996), our method focused on the variation of the shape of the LCS spectrum rather than the LCS intensity as a function of the observation angle in order to extract the electron beam parameters at the interaction region. The electron beam parameters were determined by making simultaneous fits to spectra taken across the LCS X-ray cone. We also used the variation of LCS X-ray peak energy and spectral width as a function of the detector angles to determine the electron beam angular spread, and direction and compared the results to the previous method. Experimental data show that in addition to being viewed as potential bright, tunable and monochromatic X-ray source, LCS can provide important information on electron beam pulse length, direction, energy, angular, and energy spread. Since the quality of LCS X-ray peaks, such as degree of monochromaticity, peak energy and flux, depends strongly on the electron beam parameters, LCS can therefore be viewed as an important non-destructive means for electron beam diagnostics.

Type
Research Article
Copyright
© 2006 Cambridge University Press

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