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Large field-of-view X-ray imaging by using a Fresnel zone plate

Published online by Cambridge University Press:  05 January 2012

Xiao-Fang Wang*
Affiliation:
Department of Modern Physics, University of Science and Technology of China, Hefei, China
Jin-Yu Wang
Affiliation:
Department of Modern Physics, University of Science and Technology of China, Hefei, China
Xiao-Hu Chen
Affiliation:
Department of Modern Physics, University of Science and Technology of China, Hefei, China
Xin-Gong Chen
Affiliation:
Department of Modern Physics, University of Science and Technology of China, Hefei, China
Lai Wei
Affiliation:
Department of Modern Physics, University of Science and Technology of China, Hefei, China
*
Address correspondence and reprint requests to: Xiao-Fang Wang, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China. E-mail: [email protected]

Abstract

To diagnose the implosion of a laser-driven-fusion target such as the symmetry, the hydrodynamic instability at the interface, a high-resolution, large field-of-view kilo-electron-volt X-ray imaging is required. A Kirkpatrick-Baez (K-B) microscope is commonly used, but its field of view is limited to a few hundred microns as the resolution decreases rapidly with the increase of the field of view. A higher resolution could be realized by using a Fresnel zone plate (FZP) for imaging. Presented in this work is a numerical study on the imaging properties of an FZP at Ti-Kα wavelength of 0.275 nm, and a comparison to a K-B imager. It is found that the FZP can realize not only a resolution better than 1 µm, but also a field-of-view larger than 20 mm when the FZP is illuminated by X-rays of spectral bandwidth less than 1.75%. These results indicate the feasibility of applying the FZP in high-resolution, large field-of-view X-ray imaging.

Type
Research Article
Copyright
Copyright © Cambridge University Press 2011

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