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The influence of a shield on intense ion beam transportation

Published online by Cambridge University Press:  09 July 2013

A.I. Pushkarev ,
Yu.I. Isakova  and
I.P. Khailov
A.I. Pushkarev*
Affiliation:
Tomsk Polytechnic University, Tomsk, Russia
Yu.I. Isakova
Affiliation:
Tomsk Polytechnic University, Tomsk, Russia
I.P. Khailov
Affiliation:
Tomsk Polytechnic University, Tomsk, Russia
*
Address correspondence and reprint requests to: A.I. Pushkarev, Tomsk Polytechnic University, Lenin av. 30, Tomsk, Russia634050. E-mail: [email protected]
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Abstract

This article presents the results of a study on transportation of a pulse ion beam of gigawatt power. This beam is formed by a self-magnetically insulated diode with an explosive-emission cathode. The experiments have been performed using the TEMP-4M pulsed ion accelerator configured in double-pulse formation mode with the first negative pulse (300–500 ns, 100–150 kV), followed by the second positive pulse (150 ns, 250–300 kV). To increase the effectiveness of ion beam focusing, a metal shield is installed on a grounded electrode. Investigations are performed using a strip focusing diode, a cone diode, and a spiral diode with metal shields of different constructions. We observed that the beam diameter at the focus decreases from 60 mm (without shield) to 40–42 mm (with a shield), which leads to an increase in the energy density by a factor of 1.5–2 being 4–5 J/cm2 at the focus. We analyzed different mechanisms for ion trajectories deviation from an ideal one: Coulomb repulsion due to incomplete space charge neutralization, influence of electromagnetic fields, etc. It is found that for a strip focusing diode the concentration of low-energy electrons accompanying the ion beam exceeds the concentration of ions by 1.3–1.5 times. The use of a metal shield improves the transportation properties of the ion beam by keeping neutralizing electrons within the beam volume which ensures its space charge neutralization during the transport.

Keywords

AcceleratorIntense ion beamsIon beam transportation and focusingSelf-magnetically insulated diode
Type
Research Article
Information
Laser and Particle Beams , Volume 31 , Issue 3 , September 2013 , pp. 493 - 501
Copyright
Copyright © Cambridge University Press 2013 

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References

REFERENCES

Bleycher, G.A., Krivobokov, V.P. & Pashchenko, V.P. (1999). Heat and Mass Transfer in a Solid Body under the Influence of Charged Particles Intense Beams. Novosibirsk: Science.Google Scholar
Bystritskii, V. & Didenko, A. (1984). Intense Ion Beams. Moscow: Energoatomizdat.Google Scholar
Bystritskii, V., Glyshko, Yu., Sinebryukhov, A. & Kharlov, A. (1991). Experiments on high power ion beam generation in self-insulated diodes. Laser Part. Beams 9, 691–698.CrossRefGoogle Scholar
Davis, H., Bartsch, R., Olson, J., Rej, D. & Waganaar, W. (1997). Intense ion beam optimization and characterization with infrared imaging. J. Appl. Phys. 82, 3223–3231.CrossRefGoogle Scholar
Furman, É., Stepanov, A. & Furman, N. (2007). Ionic diode. Techn. Phys. 52, 621.CrossRefGoogle Scholar
Humphries, S. (1990). Charged Particle Beams. New York: Wiley.Google Scholar
Isakova, Yu.I. (2011). Diagnostic equipment for the TEMP-4M generator of high-current pulsed ion beams. J. Korean Phys. Soc. 59, 3531–3535.CrossRefGoogle Scholar
Isakova, Yu.I. & Pushkarev, A.I. (2013). Thermal imaging diagnostics of powerful ion beams. Instrum. Exper. Techn. 56, 185–192.CrossRefGoogle Scholar
Morozov, A.I. (2006). Introduction in Plasma Dynamics. Boca Raton: CRC Press.Google Scholar
Olson, C.L. (1982). Ion beam propagation and focusing. J. Fusion Ener. 1, 309–339.CrossRefGoogle Scholar
Pushkarev, A., Isakova, Yu. & Guselnikov, V. (2011). Limitation of the electron emission in an ion diode with self-magnetic insulation. Phys. Plasmas 18, 083109.CrossRefGoogle Scholar
Pushkarev, A.I. & Isakova, Yu.I. (2012 a). A gigawatt power pulsed ion beam generator for industrial application. Surface and Coatings Technology doi:10.1016/j.surfcoat.2012.05.094.Google Scholar
Pushkarev, A.I., Isakova, Yu.I. & Khailov, I.P. (2012 b) Shot-to-shot reproducibility of a self-magnetically insulated ion diode. Rev. Sci. Instr. 83, 073309.CrossRefGoogle ScholarPubMed
Pushkarev, A.I. & Isakova, Yu.I. (2012 c). Self-Magnetically Insulated Ion Diode: Analytical Review and Experimental Researches. New York: Academic Publishing.CrossRefGoogle Scholar
Pushkarev, A.I. & Isakova, Yu.I. (2012 d). A spiral self-magnetically insulated ion diode. Laser Part. Beams 30, 427–433.CrossRefGoogle Scholar
Yatsui, K., Tokuchi, A., Tanaka, H., Ishizuka, H., Kawai, A., Sai, E., Masugata, K., Ito, M. & Matsui, M. (1985). Geometric focusing of intense pulsed ion beams from racetrack type magnetically insulated diodes. Laser Part. Beams 3, 119–155.CrossRefGoogle Scholar
Zieher, K.W. (1984 a). Investigation of a pulsed self-magnetically Bθ insulated ion diode. Nucl. Instr. Meth. Phys. Res. 228, 161–168.CrossRefGoogle Scholar
Zieher, K.W. (1984 b). Necessary condition for current neutralization of an ion beam propagating into vacuum from a self-magnetically Bθ-insulated ion diode. Nucl. Instr. Meth. 228, 169–173.CrossRefGoogle Scholar