Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-24T17:39:01.106Z Has data issue: false hasContentIssue false
  • English
  • Français

Experimental Investigations on Dynamic Characteristics of a Multilayer Piezoelectric Stack Actuator

Published online by Cambridge University Press:  26 July 2012

Hsien-Yang Lin  and
Chien-Ching Ma
Hsien-Yang Lin*
Affiliation:
Department of Mechanical Engineering, National Taiwan University, Taipei, Taiwan 10617, R.O.C.
Chien-Ching Ma*
Affiliation:
Department of Mechanical Engineering, National Taiwan University, Taipei, Taiwan 10617, R.O.C.
*
* Graduate student
** Professor
Get access

Abstract

Multilayer piezoelectric stack actuators are widely used in many industrial applications and the investigation on the dynamic behavior of this element is needed. In this study, two optical interferometric techniques called amplitude-fluctuation electronic speckle pattern interferometry (AF-ESPI) and laser Doppler vibrometer (LDV) are used to experimentally investigate the vibration characteristics of a single-layer piezoelectric disc and a multilayer piezoelectric stack actuator. These two techniques are full-field measurement for AF-ESPI and point-wise displacement measurement for LDV. Because the clear fringe patterns obtained by the AF-ESPI method will be shown only at resonant frequencies, both the resonant frequencies and corresponding vibration mode shapes of the piezoelectric disc and the multilayer piezoelectric stack actuator are obtained simultaneously by the AF-ESPI method. Interferometric fringe patterns for both the in-plane and out-of-plane vibration mode shapes are demonstrated. In addition to the proposed two optical techniques, numerical computations based on a commercially available finite element package are presented for comparison with the experimental results. Good agreement between the measured data by experimental methods and the numerical results predicted by FEM is found in resonant frequencies and mode shapes for the single-layer piezoelectric disc. However, some discrepancies are observed for the results obtained by AF-ESPI and impedance analysis for the multilayer piezoelectric stack actuator. A detailed discussion is made to address important issues of this problem.

Keywords

AF-ESPIImpedance analysisPiezoelectric discVibrationResonant frequencyMode shape
Type
Articles
Information
Journal of Mechanics , Volume 18 , Issue 2 , June 2002 , pp. 95 - 102
Copyright
Copyright © The Society of Theoretical and Applied Mechanics, R.O.C. 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1]Wolff, A., Cramer, D., Hellebrand, H.Probst, I. and Lubitz, K., “Optical Two Channel Elongation Measurement of PZT Piezoelectric Multilayer Stack Actuators,” Proceedings of the Ninth IEEE International Symposium on Applications of Ferroelectronics, pp. 755–757 (1994).Google Scholar
[2]Damjanovic, D., “Nonlinear Piezoelectric Response in Ferroelectric Ceramics,” Piezoelectric Materials: Advances in Science, Technology and Applications, Kluwer Academic Publishers, Netherlands, pp. 123–135 (2000).CrossRefGoogle Scholar
[3]Janocha, H. and Clephas, B., “Measurement and Simulation of the Electromechanical Behavior of Piezoelectric Stack Transducers,” Piezoelectric Materials: Advances in Science, Technology and Applications, Kluwer Academic Publishers, Netherlands, pp. 179–190 (2000).CrossRefGoogle Scholar
[4]Moilanen, H. and Leppävuori, S., “Laser Interferometric Measurement of Displacement-Field Characteristics of Piezoelectric Actuators and Actuator Materials,” Sensors and Actuators a Physical, 92, pp. 326–334 (2001).CrossRefGoogle Scholar
[5]Butters, J. N. and Leendertz, J. A., “Speckle Patterns and Holographic Techniques in Engineering Metrology,” Optics and Laser Technology, 3, pp. 26–30 (1971).CrossRefGoogle Scholar
[6]Jones, R. and Wykes, C., Holographic and Speckle Interferometry, Cambridge, England: Cambridge University Press, pp. 162–196 (1989).CrossRefGoogle Scholar
[7]Wykes, C., “Use of Electronic Speckle Pattern Interferometry (ESPI) in the Measurement of Static and Dynamic Surface Displacements,” Optics and Laser Technology, 21, pp. 400–406 (1982).Google Scholar
[8]Creath, K. and Gudmunn, A., “Vibration-Observation Techniques for Digital Speckle-Pattern Interferometry,” Journal of the Optical Society of America A, 2, pp. 1629–1636 (1985).CrossRefGoogle Scholar
[9]Nakadate, S., “Vibration Measurement Using Phase-Shifting Speckle Pattern Interferometry, Applied Optics, 25, pp. 4162–4167 (1986).CrossRefGoogle ScholarPubMed
[10]Wang, W. C., Hwang, C. H. and Lin, S. Y., “Vibration Measurement by the Time-Averaging Electronic Speckle Pattern Interferometry Method,” Applied Optics, 35, pp. 4502–4509 (1996).CrossRefGoogle Scholar
[11]Huang, C. H. and Ma, C. C., “Vibration Characteristics for Piezoelectric Cylinders Using Amplitude-Fluctuation Electronic Speckle Pattern Interferometry,” AIAA Journal, 36, pp. 2262–2268 (1998).CrossRefGoogle Scholar
[12]Ma, C. C. and Huang, C. H., “The Investigation of Three-Dimensional Vibration for Piezoelectric Rectangular Parallelepipeds Using the AF-ESPI Method,” IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 48, pp. 142–153 (2001).Google Scholar
[13]ABAQUS User's Manual, ver. 5.8, Pawtucket, RI: Hibbit, Karlsson, and Sorensen, Inc. (1998).Google Scholar
[14]Lee, C. K. and Wu, G. Y., “High Performance Doppler Interferometer for Advanced Optical Storage System,” Japanese Journal of Applied Physics, 38, pp. 1730–1741 (1999).CrossRefGoogle Scholar
[15]AVID User's Manual, Ahead Optoelectronics, Inc.Google Scholar