Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Jennett, Nigel M.
Aldrich-Smith, Giles
and
Maxwell, Antony S.
2004.
Non-Destructive Measurement of the Density of Thin Coatings by a Combination of Instrumented (Nano) Indentation and Acoustical Techniques..
MRS Proceedings,
Vol. 841,
Issue. ,
Hurley, D.C.
Geiss, R.H.
Kopycinska-Müller, M.
Müller, J.
Read, D.T.
Wright, J.E.
Jennett, N.M.
and
Maxwell, A.S.
2005.
Anisotropic elastic properties of nanocrystalline nickel thin films.
Journal of Materials Research,
Vol. 20,
Issue. 5,
p.
1186.
Chérault, N.
Carlotti, G.
Casanova, N.
Gergaud, P.
Goldberg, C.
Thomas, O.
and
Verdier, M.
2005.
Mechanical characterization of low-k and barrier dielectric thin films.
Microelectronic Engineering,
Vol. 82,
Issue. 3-4,
p.
368.
Ni, Wangyang
and
Cheng, Yang-Tse
2005.
Modeling conical indentation in homogeneous materials and in hard films on soft substrates.
Journal of Materials Research,
Vol. 20,
Issue. 2,
p.
521.
Cree, A. M.
Hainsworth, S. V.
and
Weidmann, G. W.
2006.
Strain–energy method for determining residual stresses in anodised thin films.
Transactions of the IMF,
Vol. 84,
Issue. 5,
p.
246.
Jennett, N.M.
and
Gee, M.G.
2006.
Surface Coatings for Protection Against Wear.
p.
58.
Bai, Mao-sen
Xiao, Xia
Li, Zhi-guo
Yao, Su-ying
and
Ruan, Gang
2006.
Investigation of SAWs Propagating on the Nano-porous Film.
p.
1456.
Zheng, Y P
Choi, A P C
Ling, H Y
and
Huang, Y P
2009.
Simultaneous estimation of Poisson's ratio and Young's modulus using a single indentation: a finite element study.
Measurement Science and Technology,
Vol. 20,
Issue. 4,
p.
045706.
Wei, Zhongxin
Zhang, Guoping
Chen, Hao
Luo, Jian
Liu, Ranran
and
Guo, Shengmin
2009.
A simple method for evaluating elastic modulus of thin films by nanoindentation.
Journal of Materials Research,
Vol. 24,
Issue. 3,
p.
801.
Pulecio, Sara Aida Rodríguez
Farias, María Cristina Moré
and
Souza, Roberto Martins
2010.
Finite element and dimensional analysis algorithm for the prediction of mechanical properties of bulk materials and thin films.
Surface and Coatings Technology,
Vol. 205,
Issue. 5,
p.
1386.
Nemeth, Sandor
2010.
p.
147.
Mège, F.
Volpi, F.
and
Verdier, M.
2010.
Mapping of elastic modulus at sub-micrometer scale with acoustic contact resonance AFM.
Microelectronic Engineering,
Vol. 87,
Issue. 3,
p.
416.
Zhang, Z.Y.
Dhakal, H.N.
Surip, S.N.
Popov, I.
and
Bennett, N.
2011.
Characterisation of roof tile coating degradation using nano-indentation test and surface profilometry.
Polymer Degradation and Stability,
Vol. 96,
Issue. 5,
p.
833.
Jiang, Liudi
Spearing, S.M.
Monclus, M.A.
and
Jennett, N.M.
2011.
Formation and mechanical characterisation of SU8 composite films reinforced with horizontally aligned and high volume fraction CNTs.
Composites Science and Technology,
Vol. 71,
Issue. 10,
p.
1301.
Leach, Richard K
Boyd, Robert
Burke, Theresa
Danzebrink, Hans-Ulrich
Dirscherl, Kai
Dziomba, Thorsten
Gee, Mark
Koenders, Ludger
Morazzani, Valérie
Pidduck, Allan
Roy, Debdulal
Unger, Wolfgang E S
and
Yacoot, Andrew
2011.
The European nanometrology landscape.
Nanotechnology,
Vol. 22,
Issue. 6,
p.
062001.
Ogi, Hirotsugu
Nakamura, Nobutomo
and
Hirao, Masahiko
2011.
Picosecond ultrasound spectroscopy for studying elastic modulus of thin films: a review.
Nondestructive Testing and Evaluation,
Vol. 26,
Issue. 3-4,
p.
267.
Sebastiani, M.
Eberl, C.
Bemporad, E.
Korsunsky, A.M.
Nix, W.D.
and
Carassiti, F.
2014.
Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale.
Surface and Coatings Technology,
Vol. 251,
Issue. ,
p.
151.
Oppermann, Christian
Schmidt, Gerhard
and
Drossel, Welf-Guntram
2014.
Approach to an FE simulation of coating damage on bulk metal forming tools.
Diamond and Related Materials,
Vol. 50,
Issue. ,
p.
157.
Liu, S.
Raghavan, R.
Zeng, X. T.
Michler, J.
and
Clegg, W. J.
2014.
Compressive deformation and failure of CrAlN/Si3N4 nanocomposite coatings.
Applied Physics Letters,
Vol. 104,
Issue. 8,
p.
081919.
Lunt, Alexander J.G.
and
Korsunsky, Alexander M.
2015.
A review of micro-scale focused ion beam milling and digital image correlation analysis for residual stress evaluation and error estimation.
Surface and Coatings Technology,
Vol. 283,
Issue. ,
p.
373.