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Transmission-electron-microscopy study of quasi-epitaxial tungsten-bronze (Sr2.5Ba2.5Nb10O30) thin film on perovskite (SrTiO3) single crystal

Published online by Cambridge University Press:  03 March 2011

Dong Su ,
Anna Infortuna ,
Paul Muralt ,
Nava Setter  and
Marco Cantoni
Dong Su
Affiliation:
Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
Anna Infortuna
Affiliation:
Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
Paul Muralt
Affiliation:
Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
Nava Setter*
Affiliation:
Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
Marco Cantoni
Affiliation:
Interdisciplinary Center for Electron Microscopy (CIME), Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

Strontium barium niobate (Sr2.5Ba2.5Nb10O30) thin films were deposited on (001) SrTiO3 single-crystalline substrates by pulsed laser deposition. The growth nature was investigated by transmission electron microscopy (TEM). Selected-area electron diffraction and high-resolution transmission electron microscopy revealed the existence of six types of grains. These grains grew on the substrate in a partially epitaxial fashion. Geometrical models were built, which were confirmed by TEM observations. Based on the TEM results and geometrical analysis, a crystallographic model was developed. The strain nature resulting from the growth columns is discussed in this report.

Keywords

EpitaxyFilmTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 22 , Issue 1 , January 2007 , pp. 157 - 163
Copyright
Copyright © Materials Research Society 2007

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References

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