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Transmission electron microscopy and x-ray structural investigation of La0.7Ca0.3MnO3 thin films

Published online by Cambridge University Press:  31 January 2011

Y. H. Li ,
K. A. Thomas ,
P. S. I. P. N. de Silva ,
L. F. Cohen ,
A. Goyal ,
M. Rajeswari ,
N. D. Mathur ,
M. G. Blamire ,
J. E. Evetts  and
T. Venkatesan
...Show all authors
Y. H. Li
Affiliation:
Department of Materials, Imperial College, Prince Consort Road, London, SW7 2BP, United Kingdom
K. A. Thomas
Affiliation:
Department of Materials, Imperial College, Prince Consort Road, London, SW7 2BP, United Kingdom
P. S. I. P. N. de Silva
Affiliation:
Blackett Laboratory, Imperial College, Prince Consort Road, London SW7 2BZ, United Kingdom
L. F. Cohen
Affiliation:
Blackett Laboratory, Imperial College, Prince Consort Road, London SW7 2BZ, United Kingdom
A. Goyal
Affiliation:
Department of Materials Science, University of Cambridge, Cambridge CB2 3QZ, United Kingdom
M. Rajeswari
Affiliation:
Department of Physics and Electrical Engineering, University of Maryland, College Park, Maryland
N. D. Mathur
Affiliation:
Department of Materials Science, University of Cambridge, Cambridge, CB2 3QZ, United Kingdom
M. G. Blamire
Affiliation:
Department of Materials Science, University of Cambridge, Cambridge, CB2 3QZ, United Kingdom
J. E. Evetts
Affiliation:
Department of Materials Science, University of Cambridge, Cambridge, CB2 3QZ, United Kingdom
T. Venkatesan
Affiliation:
Department of Physics and Electrical Engineering, University of Maryland, College Park, Maryland
J. L. MacManus-Driscoll
Affiliation:
Department of Materials, Imperial College, Prince Consort Road, London SW7 2BP, United Kingdom
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Abstract

The structural changes and magnetoresistance (MR) properties of as-grown and post-annealed La0.7Ca0.3MnO3 films were investigated by transmission electron microscopy (TEM) and x-ray diffraction (XRD). The data for the films were compared to that for bulk La0.7Ca0.3MnO3 post-annealed under the same conditions. The main structure of the as-grown films was face-centered pseudo-cubic with a doubled perovskite unit cell, of size ∼2ap × ∼2ap × 2ap, where ap is the single perovskite parameter. The phase showed a cube-on-cube epitaxy with the underlying LaAlO3 substrate. Upon annealing to a saturation point, a minor primitive pseudo-tetragonal structure evolved, of cell parameters . A total of four possible orientations of the two structures was observed by TEM, comprised of one orientation of the ∼ 2ap × ∼ 2ap × ∼ 2ap cell, i.e., the cube-on-cube epitaxy, giving rise to (00l) peaks in x-ray, and three orientations of the cell, giving rise to a single (00l)/(hk0) peak in x-ray. The bulk La0.7Ca0.3MnO3 sample also contains the × structure. The difference between the bulk and the film and the effects of annealing on films can be ascribed to the influence of strain between the film and substate, induced by lattice mismatch.

Type
Articles
Information
Journal of Materials Research , Volume 13 , Issue 8 , August 1998 , pp. 2161 - 2169
Copyright
Copyright © Materials Research Society 1998

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