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Thermally stimulated luminescence and electron paramagnetic resonance studies of Eu3+-doped yttrium borate

Published online by Cambridge University Press:  01 May 2006

M. Anitha ,
Manoj Mohapatra ,
R.M. Kadam ,
T.K. Seshagiri ,
A.K. Tyagi  and
V. Natarajan
M. Anitha
Affiliation:
Rare Earth Development Section, Bhabha Atomic Research Center, Mumbai—400 085, India
Manoj Mohapatra
Affiliation:
Radiochemistry Division, Bhabha Atomic Research Center, Mumbai—400 085, India
R.M. Kadam*
Affiliation:
Radiochemistry Division, Bhabha Atomic Research Center, Mumbai—400 085, India
T.K. Seshagiri
Affiliation:
Radiochemistry Division, Bhabha Atomic Research Center, Mumbai—400 085, India
A.K. Tyagi
Affiliation:
Chemistry Division, Bhabha Atomic Research Center, Mumbai—400 085, India
V. Natarajan
Affiliation:
Radiochemistry Division, Chemistry Division, Bhabha Atomic Research Center, Mumbai—400 085, India
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

Thermally stimulated luminescence (TSL) and electron paramagnetic resonance (EPR) studies were carried out on gamma-irradiated europium-doped yttrium borate samples in the temperature range 300–600 K. TSL studies showed the presence of two glow peaks, a relatively weaker one at 390 K and an intense one at around 550 K. Room-temperature EPR spectrum of irradiated samples revealed the formation of two hole trapped radicals, namely, BO32− and O2−. Temperature variation studies showed drastic reduction in the EPR signal intensities of these radicals around 390 and 550 K indicating thermal destruction of O2− and BO32− radicals, respectively. The observed TSL emission is caused by the recombination of thermally released holes from O2− and BO32− radical ions with electrons. The energy released in electron-hole recombination process is used for the excitation of Eu3+ ion resulting in TSL glow peaks. TSL emission studies confirmed that Eu3+ acts as luminescent center for both the peaks.

Keywords

Electron spin resonanceLuminescence
Type
Articles
Information
Journal of Materials Research , Volume 21 , Issue 5 , May 2006 , pp. 1117 - 1123
Copyright
Copyright © Materials Research Society 2006

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