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Synchrotron x-ray scattering of ZnO nanorods: Periodic ordering and lattice size

Published online by Cambridge University Press:  01 April 2005

Zuoming Zhu ,
Tamar Andelman ,
Ming Yin ,
Tsung-Liang Chen ,
Steven N. Ehrlich ,
Stephen P. O'Brien  and
Richard M. Osgood Jr.
Zuoming Zhu
Affiliation:
Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027
Tamar Andelman
Affiliation:
Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027
Ming Yin
Affiliation:
Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027
Tsung-Liang Chen
Affiliation:
Department of Electrical Engineering, Columbia University, New York, New York 10027
Steven N. Ehrlich
Affiliation:
National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973
Stephen P. O'Brien
Affiliation:
Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027
Richard M. Osgood Jr.*
Affiliation:
Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

We demonstrate that synchrotron x-ray powder diffraction (XRD) is a powerful technique for studying the structure and self-organization of zinc-oxide nanostructures. Zinc-oxide nanorods were prepared by a solution-growth method that resulted in uniform nanorods with 2-nm diameter and lengths in the range 10–50 nm. These nanorods were structurally characterized by a combination of small-angle and wide-angle synchrotron XRD and transmission electron microscopy (TEM). Small-angle XRD and TEM were used to investigate nanorod self-assembly and the influence of surfactant/precursor ratio on self-assembly. Wide-angle XRD was used to study the evolution of nanorod growth as a function of synthesis time and surfactant/precursor ratio.

Keywords

NanoparticleSelf-assemblyX-ray diffraction (XRD)
Type
Research Article
Information
Journal of Materials Research , Volume 20 , Issue 4 , April 2005 , pp. 1033 - 1041
Copyright
Copyright © Materials Research Society 2005

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