Hostname: page-component-745bb68f8f-v2bm5 Total loading time: 0 Render date: 2025-01-27T14:18:35.400Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface, interface, and thin-film magnetism

Published online by Cambridge University Press:  31 January 2011

L. M. Falicov ,
Daniel T. Pierce ,
S. D. Bader ,
R. Gronsky ,
Kristl B. Hathaway ,
Herbert J. Hopster ,
David N. Lambeth ,
S. S. P. Parkin ,
Gary Prinz  and
Myron Salamon
...Show all authors
L. M. Falicov
Affiliation:
Department of Physics, University of California-Berkeley, and Lawrence Berkeley Laboratory, Berkeley, California 94720
Daniel T. Pierce
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
S. D. Bader
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
R. Gronsky
Affiliation:
Department of Materials Science and Mineral Engineering, University of California-Berkeley, and Lawrence Berkeley Laboratory, Berkeley, California 94720
Kristl B. Hathaway
Affiliation:
Office of Naval Research, Arlington, Virginia 22217-5000
Herbert J. Hopster
Affiliation:
Department of Physics, University of California-Irvine, Irvine, California 92717
David N. Lambeth
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213-3890
S. S. P. Parkin
Affiliation:
I.B.M. Almaden Research Center, San Jose, California 95120-6099
Gary Prinz
Affiliation:
Naval Research Laboratory, Washington, DC 20375
Myron Salamon
Affiliation:
Department of Physics, University of Illinois, Urbana, Illinois 61801
Ivan K. Schuller
Affiliation:
Department of Physics, University of California-San Diego, La Jolla, California 92093
R. H. Victora
Affiliation:
Diversified Technologies Research Laboratories, Eastman Kodak Company, Rochester, New York 14650-2017
Get access

Abstract

A comprehensive review and state of the art in the field of surface, interface, and thin-film magnetism is presented. New growth techniques which produce atomically engineered novel materials, special characterization techniques to measure magnetic properties of low-dimensional systems, and computational advances which allow large complex calculations have together stimulated the current activity in this field and opened new opportunities for research. The current status and issues in the area of material growth techniques and physical properties, characterization methods, and theoretical methods and ideas are reviewed. A fundamental understanding of surface, interface, and thin-film magnetism is of importance to many applications in magnetics technology, which is also surveyed. Questions of fundamental and technological interest that offer opportunities for exciting future research are identified.

Type
Materials Reports
Information
Journal of Materials Research , Volume 5 , Issue 6 , June 1990 , pp. 1299 - 1340
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Moruzzi, V. L., Janak, J. F., and Williams, A. R., Calculated Electronic Properties of Metals (Pergamon, New York, 1978).Google Scholar
2Jansen, H. J. F., Hathaway, K. B., and Freeman, A. J., Phys. Rev. B 30, 6117 (1984).Google Scholar
3Wolfarth, E. P., Ferromagnetic Materials edited by Wolfarth, E. P. (North Holland, Amsterdam, 1980), Vol. 1, p. 1.Google Scholar
4Norman, M. R. and Freeman, A. J., in The Challenge of d and f Electrons, edited by Salahub, D. R. and Zerner, M. C. (American Chemical Society, Washington, DC, 1989), p. 273.Google Scholar
5Fu, C. L., Freeman, A. J., and Oguchi, T., Phys. Rev. Lett. 54, 2700 (1985); R. Richter, J. G. Gay, and J. R. Smith, Phys. Rev. Lett. 54, 2704 (1985).CrossRefGoogle Scholar
6 See, for example, Wang, D., Freeman, A. J., and Weinert, M., J. Magn. Magn. Mat. 31–34, 891 (1983).CrossRefGoogle Scholar
7Hong, S. C, Freeman, A. J., and Fu, C. L., J. de Physique C8, 1683 (1988).Google Scholar
8Peng, S. S. and Jansen, H. J. F., J. Appl. Phys. 64, 5607 (1988).CrossRefGoogle Scholar
9Wang, C. S., Klein, B. M., and Krakauer, H., Phys. Rev. Lett. 54, 1852 (1985).CrossRefGoogle Scholar
10Hathaway, K. B., Jansen, H. J. F., and Freeman, A. J., Phys. Rev. B 31, 7603 (1985).CrossRefGoogle Scholar
11Wang, C. S. and Callaway, J., Phys. Rev. B 15, 298 (1977).CrossRefGoogle Scholar
12Jarlborg, T. and Peter, M., Magn, J.. Magn. Mat. 42, 89 (1984).CrossRefGoogle Scholar
13A discussion of some discrepancies between theory and de Haas-van Alphen data for Co may be found in Himpsel, F. J. and Eastman, D. E., Phys. Rev. B 21, 3207 (1980).Google Scholar
14 See, for example, Victora, R. H., in Magnetic Properties of Low-Dimensional Systems, edited by Falicov, L.M. and Morán-Lépez, J. L. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1986), p. 25.Google Scholar
15Car, R. and Parinello, M., Phys. Rev. Lett. 55, 2471 (1985); ibid. 60, 204 (1988).CrossRefGoogle Scholar
16Brooks, H., Phys. Rev. 58, 909 (1940).CrossRefGoogle Scholar
17Hutchings, M.T., in Solid State Physics, edited by Seitz, F. and Turnbull, D. (Academic Press, New York, 1964), Vol. 16, p. 227, and references therein.Google Scholar
18Néel, L., J. Phys. Rad. 15, 225 (1954).CrossRefGoogle Scholar
19Mattis, D.C., The Theory of Magnetism (Harper and Row, New York, 1965), Chap. 9.CrossRefGoogle Scholar
20Yang, C. N., Phys. Rev. 85, 809 (1952).CrossRefGoogle Scholar
21Toda, M., Kubo, R., and Saito, N., Statistical Physics I (Equilibrium Statistical Mechanics) (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1983), p. 149.Google Scholar
22Stanley, H. E., Introduction to Phase Transitions and Critical Phenomena (Oxford University Press, Oxford, 1971).Google Scholar
23Kosterlitz, J. M. and Thouless, D. J., in Progress in Low Temperature Physics, edited by Brewer, D. F. (North Holland, Amsterdam, 1978), Vol. VII B.Google Scholar
24Fisher, M. E. and Ferdinand, A. E., Phys. Rev. Lett. 19 169 (1967).CrossRefGoogle Scholar
25Lipowsky, R., Phys. Rev. Lett. 49 1575 (1982); R. Lipowsky and W. Speth, Phys. Rev. B. 28 2983 (1983); R. Lipowsky, Z. Phys. B 55, 345 (1984); R. Lipowsky, Phys. Rev. Lett. 52 1429 (1984); R. Lipowsky, Phys. Rev. B 32, 1731 (1985); R. Lipowsky, Ferroelectrics 73, 69 (1987); R. Lipowsky, in Random Fluctuations and Pattern Growth, edited by H. E. Stanley and N. Ostrowsky (Kluwer Academic, Dordrecht, 1988).CrossRefGoogle Scholar
26Dietrich, S., in Phase Transitions and Critical Phenomena edited by Domb, C. and Leibowitz, J. L. (Academic Press, London, 1988), Vol. 8, p. 1.Google Scholar
27 See, for instance, Ziman, J. M., Principle of the Theory of Solids (Cambridge, 1972), 2nd ed., pp. 250ff, 301ff; A. B. Pippard, Magnetoresistance in Metals (Cambridge University Press, Cambridge, 1989).CrossRefGoogle Scholar
28Taylor, G. R., Isin, A., and Coleman, R.V., Phys. Rev. 165 621 (1968); Coleman, R.V., Morris, R.C., and Sellmyer, D.J., Phys. Rev. B 8, 317 (1973); R.W. Klaffky and R.V. Coleman, Phys. Rev. B 10, 4803 (1974).CrossRefGoogle Scholar
29Cabrera, G. G. and Falicov, L. M., Phys. Status Solidi B 61 539 (1974); ibid., 62 217 (1974); Cabrera, G. G. and Falicov, L. M., Phys. Rev. B 11 2651 (1975).CrossRefGoogle Scholar
30Brown, W. F., Micromagnetics (Wiley, New York, 1963).Google Scholar
31Friedberg, R. and Paul, D.I., Phys. Rev. Lett. 34, 1234 (1975).CrossRefGoogle Scholar
32Victora, R. H., Phys. Rev. Lett. 58 1788 (1987).CrossRefGoogle Scholar
33Smith, N., J. Appl. Phys. 63, 2932 (1988); Scheinfein, M.R., Unguris, J., Celotta, R. J., and Pierce, D.T., Phys. Rev. Lett. 63 668 (1989).CrossRefGoogle Scholar
34 See, for instance, Meyer, K.E., Schuller, I.K., and Falco, C.M., J. Appl. Phys. 52, 5803 (1981).CrossRefGoogle Scholar
35Venkatesan, T., Wu, X.D., Dutta, B.D., Inam, A., Hedge, M.S., Hwang, D. M., Chang, C. C., Nazar, L., and Wilkens, B., in Science and Technology of Thin Film Superconductors, edited by McConnell, R. D. and Wolf, S. A. (Plenum, New York, 1988), p. 1.Google Scholar
36Kaplan, R., J. Vac. Sci. Tech. A1 551 (1983).CrossRefGoogle Scholar
37Ceck, R.E. and Alessandrini, E.I., Trans. Am. Soc. Met. 51 50 (1959).Google Scholar
38 See, for instance, Epitaxial Growth, edited by Matthews, J.W. (Academic Press, New York, 1975).Google Scholar
39Erwin, R.W., Rhyne, J. J., Salamon, M. B., Borchers, J., Sinha, S., Du, R., Cunningham, J. E., and Flynn, C. P., Phys. Rev. B 35, 6808 (1987).CrossRefGoogle Scholar
40 For an extensive compilation of epitaxial systems see, for instance, E. Grünbaum, Ref. 38, p. 611.Google Scholar
41 See, for instance, Staudhammer, K. P. and Meur, O. E., Atlas of Binary Alloys (Marcel Dekker, New York, 1973).Google Scholar
42 See various articles in Physics, Fabrication and Applications of Multilayered Structures edited by Dhez, P. and Weisbuch, C. (Plenum Press, New York, 1988).CrossRefGoogle Scholar
43Chambers, S. A., Wagener, J. J., and Weaver, J. H., Phys. Rev. B 36, 8992 (1987).CrossRefGoogle Scholar
44Steigerwald, D A. and Egelhoff, W.F., Jr., Surf. Sci. 192 L887 (1987).CrossRefGoogle Scholar
45Macedo, W. A. A. and Keune, W., Phys. Rev. Lett. 61 475 (1988).CrossRefGoogle Scholar
46Liu, C., Moog, E. R., and Bader, S. D., Phys. Rev. Lett. 60, 2422 (1988).CrossRefGoogle Scholar
47Stampanoni, M., Vaterlaus, A., Aeschlimann, M., Meier, F., and Pescia, D., J. Appl. Phys. 64, 5321 (1988).CrossRefGoogle Scholar
48Liu, C. and Bader, S.D., Physica B 161 253 (1989).CrossRefGoogle Scholar
49Blugel, S., Weinert, M., and Dedericks, P. H., Phys. Rev. Lett. 60, 1077 (1988).CrossRefGoogle Scholar
50Allan, G., Surf. Sci. 74 79 (1978).CrossRefGoogle Scholar
51Grempel, D. R., Phys. Rev. B 24, 3928 (1981).CrossRefGoogle Scholar
52Victora, R. H. and Falicov, L. M., Phys. Rev. B 31 7335 (1985).CrossRefGoogle Scholar
53Prinz, G. A., Phys. Rev. Lett. 54 1051 (1985).CrossRefGoogle Scholar
54Takahashi, T. and Bassett, W. A., Science 145, 483 (1964).CrossRefGoogle Scholar
55Moruzzi, V.L., Marcus, P.M., Schwarz, K., and Mohn, P., Phys. Rev. B 34,1784 (1986); Marcus, P. M., Moruzzi, V. L., Wang, Z. Q., Li, Y. S., and Jena, F., in Physical and Chemical Properties of Thin Metal Overlayers and Alloy Surfaces (Proc. Mater. Res. Soc. Symp.), edited by D. M. Zener and D.W. Goodman (Materials Research Society, Pittsburgh, PA, 1987), Vol. 83, p. 21.CrossRefGoogle Scholar
56Prinz, G.A., Jonker, B.T., Krebs, J. J., Ferrari, J. M., and Kovanis, F., Appl. Phys. Lett. 48 1756 (1986).CrossRefGoogle Scholar
57Ruckman, M.W., Joyce, J. J., and Weaver, J. J., Phys. Rev. B 33, 7029 (1986).CrossRefGoogle Scholar
58Weller, D. and Alvarado, S. F., J. Appl. Phys. 59, 2908 (1986).CrossRefGoogle Scholar
59Kwo, J., McWhan, D. B., Hong, M., Gyorgy, E. M., Feldman, L. C., and Cunningham, J. E., in Layered Structures, Epitaxy and Interfaces (Proc. Mater. Res. Soc. Symp.), edited by Gibson, J. M. and Dawson, L. R. (Materials Research Society, Pittsburgh, PA, 1985), Vol. 37, p. 509.Google Scholar
60Homma, H., Yang, K., and Schuller, I. K., Phys. Rev. B 36, 9435 (1987).CrossRefGoogle Scholar
61Rhyne, J. J., Erwin, R.W., Salamon, M. B., Sinha, S., Borchers, J., Cunningham, J. E., and Flynn, C. P., J. Less-Common Metals 148, 17 (1989).CrossRefGoogle Scholar
62Majkrzak, C.F., Gibbs, D., Boni, P., Goldman, A.I., Kwo, J., Hong, M., Hsieh, T. C., Fleming, R. M., McWhan, D. B., Cable, J.W., Bohr, J., Grimm, H., and Chien, C.L., J. Appl. Phys. 63, 3447 (1988).CrossRefGoogle Scholar
63Kwo, J., in Thin Film Growth Techniques for Low-Dimensional Structures edited by Farrow, R.F.C., Parkin, S.S.P., Dobson, P. J., Neave, J. H., and Arrott, A. S., NATO ASI Series B (Plenum, New York 1987), Vol. 163, p. 337.CrossRefGoogle Scholar
64Du, R., Tsui, F., and Flynn, C. P., Phys. Rev. B 38, 2941 (1988).CrossRefGoogle Scholar
65Flynn, C.P., Tsui, F., Salamon, M. B., Erwin, R.W., and Rhyne, J. J, J. Phys.: Condensed Matter 1, 5997 (1989).CrossRefGoogle Scholar
66 See, for instance, Bruce, L. A. and Jaeger, H., Phil. Mag. A 38, 223 (1978).CrossRefGoogle Scholar
62Yang, K.Y., Homma, H., and Schuller, I. K., J. Appl. Phys. 63, 4066 (1988).CrossRefGoogle Scholar
68 See various articles in Mater. Res. Soc. Bull. XIV (1989).Google Scholar
69Berkowitz, A. E. and Grenier, J. H., J. Appl. Phys. 36 3330 (1965); J. Bransky, I. Bransky, and A. A. Hirsch, J. Appl. Phys. 41 183 (1970).CrossRefGoogle Scholar
70Alexander, K. B., Walker, F. J., McKee, R. A., and List, F. A., submitted to the Am. Ceram. Soc; R.A. McKee, F. A. List, F. J. Walker, and J.R. Conner, submitted to Phys. Rev. B.Google Scholar
71Berkowitz, A. (private communication).Google Scholar
72Prinz, G. A., Mater. Res. Soc. Bull. XIII 2 (1988).Google Scholar
73Bader, S. D., in Proc. IEEE, Special Issue on Magnetics edited by R. M. White (IEEE, New York, 1990), in press.Google Scholar
74Victora, R. H. and Falicov, L. M., Phys. Rev. B 30, 259 (1984).CrossRefGoogle Scholar
75Freeman, A. J. and Fu, C. L., in Magnetic Properties of Low-Dimensional Systems edited by Falicov, L. M. and Morá-López, J. L. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1986), p. 16.Google Scholar
76Wang, D. S., Freeman, A. J., and Krakauer, H., Phys. Rev. B 24 1126 (1981).CrossRefGoogle Scholar
77Falicov, L.M., Victora, R. H., and Tersoff, J., in The Structure of Surfaces edited by Van Hove, M. A. and Tong, S.Y. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1985), p. 12, and references therein.Google ScholarPubMed
75Victora, R.H. and Falicov, L.M., Phys. Rev. B 31, 7335 (1985).CrossRefGoogle Scholar
79Klebanoff, L. E., Victora, R. H., Falicov, L. M., and Shirley, D. A., Phys. Rev. B 32 1997 (1985).CrossRefGoogle Scholar
80Tersoff, J. and Falicov, L. M., Phys. Rev. B 26 6186 (1982).CrossRefGoogle Scholar
81Victora, R. H., Ishida, S., and Falicov, L. M., Phys. Rev. B 30,3896 (1984).CrossRefGoogle Scholar
82Hasegawa, H., J. Phys. F: Met. Phys. 16 1555 (1986).CrossRefGoogle Scholar
83Meiklejohn, W. H. and Bean, C. P., Phys. Rev. B 102 1413 (1959).CrossRefGoogle Scholar
84 See, for example, Stoecklin, W., Parkin, S.S. P., and Scott, J. C., Phys. Rev. B 38 6854 (1988), and references therein.Google Scholar
85Yelon, A., in Physics of Thin Films edited by Francombe, M. and Hoffmann, R. (Academic Press, New York, 1971), Vol. 6, p. 205.Google Scholar
86Malozemoff, A. P., Phys. Rev. B 35, 3679 (1987); J. Appl. Phys. 63, 3874 (1988).CrossRefGoogle Scholar
87Hermsmeier, B., Osterwalder, J., Friedman, D., and Fadley, C. S., Phys. Rev. Lett. 62, 478 (1989).CrossRefGoogle Scholar
88Parkin, S. S. P. and Speriosu, V. S., in Magnetic Properties of Low-Dimensional Systems Proc. of the 2nd Int. Workshop held in San Luis Potosí, Mexico, May 22–26, 1989, edited by L. M. Falicov and J. L. Moŕan-López (Springer-Verlag, Heidelberg-Berlin-New York-Tokyo, 1989) (in press).Google Scholar
89Heinrich, B., Purcell, S.T., Dutcher, J. R., Urquhart, K. B., Cochran, J. F, and Arrott, A. S., Phys. Rev. 38 12879 (1988).CrossRefGoogle Scholar
90Nakatani, R., Kobayashi, T., Ootomo, S., and Kumusaka, N., Jpn.J. Appl. Phys. 27, 937 (1988).CrossRefGoogle Scholar
91Aeschlimann, M., Ph.D. Dissertation, ETH 8863 (1989); M. Aeschlimann, G. L. Bona, F. Meier, M. Stampanoni, A. Vaterlaus, H. C.Siegmann E. E. Marinero, and H.Notarys, IEEE Trans. Mag. MAG–24, 3180 (1988).Google Scholar
92Cain, W. C., Lee, J.W., Koeppe, P.V., and Kryder, M. H., IEEE Trans. Mag. MAG-24, 2609 (1988).CrossRefGoogle Scholar
93Kobayashi, T., Tsuji, H., Tsunashima, S., and Uchiyama, S., Jpn. I.Appl. Phys. 20, 2089 (1981).CrossRefGoogle Scholar
94Carbone, C. and Alvarado, S. F., Phys. Rev. B 36, 2433 (1987).CrossRefGoogle Scholar
95Griinberg, P., Schreiber, R., Pang, Y., Brodsky, M. B., and Sowers, H., Phys. Rev. Lett. 57, 2442 (1986); F. Saurenbach, U. Walz, L. Hinchey, P. Griinberg, and W. Zinn, J. Appl. Phys. 63, 3473 (1988).CrossRefGoogle Scholar
96Baibich, M. N., Broto, J. M., Fert, A., Nguyen Van Dau, F., Petroff, F., Etienne, P., Creuzet, G., Friederich, A., and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988).CrossRefGoogle Scholar
97Jonker, B.T., Walker, K. H., Kisker, E., Prinz, G.A., and Carbone, C.,Phys. Rev. Lett. 57, 142 (1986).CrossRefGoogle Scholar
98Gutierrez, C.J., Mayer, S. H., Qiu, Z.Q., Tang, H., and Walker, J. C., in Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers (Proc. Mater. Res. Soc. Symp.), edited by Jonker, B.T., Marinero, E. E., and Heremans, J. P. (Materials Research Society, Pittsburgh, PA, 1989), Vol. 151, p. 17.Google Scholar
99Mathon, J., Rep. Prog. Phys. 51 1 (1988).CrossRefGoogle Scholar
100Mathon, J. and Ahmad, S. B., Phys. Rev. B 37, 660 (1988);CrossRefGoogle Scholar
101Mauri, D., Scholl, D., Siegmann, H. C., and Kay, E., Phys. Rev. Lett. 62, 1900 (1988).CrossRefGoogle Scholar
102Moodera, J. S. and Meservey, R., Phys. Rev. B34, 379 (1986).CrossRefGoogle Scholar
103Slonczewski, J. C., Phys. Rev. B39, 6995 (1988).Google Scholar
104Julliere, M., Phys. Lett. 54A, 225 (1975).CrossRefGoogle Scholar
105Tedrow, P. M. and Meservey, R., Phys. Rev. B7, 318 (1973).CrossRefGoogle Scholar
106Gaefvert, U. and Maekawa, S., IEEE Trans. Mag. MAG–18, 707 (1982).Google Scholar
107Majkrzak, C. F., Cable, J. W., Kwo, J., Hong, M., McWhan, D. B., Yafet, Y., Waszczak, J. V., and Vettier, C., Phys. Rev. Lett. 56, 2700 (1986).CrossRefGoogle Scholar
108Salamon, M. B., Sinha, S., Rhyne, J. J., Cunningham, J. E., Erwin, R. W., Borchers, J., and Flynn, C. P., Phys. Rev. Lett. 56, 259 (1986).CrossRefGoogle Scholar
109Yafet, Y., Kwo, J., Hong, M., Majkrzak, C. F., and O'Brien, T., J. Appl. Phys. 63, 3453 (1988).CrossRefGoogle Scholar
110Borchers, J. A., Nieuwenhuys, G., Salamon, M. B., Flynn, C. P., Du, R., Erwin, R. W., and Rhyne, J. J., J. de Physique 49–C3, 1685 (1988).Google Scholar
111 See, for instance, Schuller, I. K. and Homma, H., Mater. Res. Soc. Bull. XII, 1 (1987).Google Scholar
112Colvard, C., Merlin, R., Klein, M. V., and Gossard, A. C., Phys. Rev. Lett. 45, 298 (1980).CrossRefGoogle Scholar
113 See, for instance, Sokoloff, J., Solid State Commun. 40, 633 (1981).CrossRefGoogle Scholar
114van Gelder, A. P., Phys. Rev. 181, 7887 (1969).CrossRefGoogle Scholar
115Camley, R. E., Rahman, T. S., and Mills, D., Phys. Rev. B27, 261 (1983).CrossRefGoogle Scholar
116Kueny, A., Khan, M. R., Schuller, I. K., and Grimsditch, M., Phys. Rev. B29, 2879 (1984).CrossRefGoogle Scholar
117“Panel Report on Fundamental Issues in Heteroepitaxy”, Monterey, CA, January 1989 (to be published).Google Scholar
118Flanders, P. J., J. Appl. Phys. 63, 3940 (1988).CrossRefGoogle Scholar
119Moog, E. R. and Bader, S. D., Superlatt. Microstr. 1, 543 (1985).CrossRefGoogle Scholar
120Urquhart, K. B., Heinrich, B., Cochran, J. F., Arrott, A. S., and Myrtle, K., J. Appl. Phys. 64, 5335 (1988).CrossRefGoogle Scholar
121Farle, M. and Baberschke, K., Phys. Rev. Lett. 58, 511 (1987).CrossRefGoogle Scholar
122Frey, Th., Jantz, W., and Stibal, S., J. Appl. Phys. 64, 6002 (1988).CrossRefGoogle Scholar
123 See Bloomberg, D. S. and Connell, G. A. N., in Magnetic Recording, Vol. II: Computer Data Storage, edited by Mee, C. D. and Daniel, E. D. (McGraw-Hill, New York, 1988).Google Scholar
124Schmidt, F., Rave, W., and Hubert, A., IEEE Trans. Magn. MAG–21, 1596 (1985).CrossRefGoogle Scholar
125Herman, D. A., Jr. and Argyle, B. E., IEEE Trans. Magn. MAG–22, 772 (1986).CrossRefGoogle Scholar
126Liu, C. and Bader, S. D., in Magnetic Properties of Low Dimensional Systems II, edited by Falicov, L. M., Mejía-Lira, F., and Morán-López, J. L. (Springer-Verlag, Berlin, 1990), p. 22.CrossRefGoogle Scholar
127Reim, W., J. Magn. Magn. Mat. 58, 1 (1986).CrossRefGoogle Scholar
128Hübner, W. and Bennemann, K. H., “Nonlinear Magneto-Optical Kerr Effect at the Nickel Surface,” preprint submitted for publication.Google Scholar
129Shen, Y. R., in Chemistry and Structure at Interfaces: New Laser and Optical Techniques, edited by Hall, R. B. and Ellis, A. B. (Verlag Chemie, Weinheim, 1986), p. 151.Google Scholar
130Hillebrands, B., Baumgart, P., and Güntherodt, G., Phys. Rev. B36, 2450 (1987).CrossRefGoogle Scholar
131Grimsditch, M., Malozemoff, A., and Brunsch, A., Phys. Rev. Lett. 43, 711 (1979).CrossRefGoogle Scholar
132Griinberg, P., Schreiber, R., Pang, Y., Brodsky, M. B., and Sowers, H., Phys. Rev. Lett. 57, 2442 (1986).CrossRefGoogle Scholar
133Heinrich, B., Arrott, A. S., Cochran, J. F., Liu, C., and Myrtle, K., J. Vac. Sci. Technol. A4, 1376 (1986).CrossRefGoogle Scholar
134Campagna, M., Pierce, D. T., Meier, F., Sattler, K., and Siegmann, H. C., Adv. Electronics and Electron Phys. 41, 113 (1976).CrossRefGoogle Scholar
135Kisker, E., Schroeder, K., Gudat, W., and Campagna, M., Phys. Rev. B31, 329 (1985).CrossRefGoogle Scholar
136Johnson, P. D., Clarke, A., Brookes, N. B., Hulbert, S. L., Sinkovic, B., and Smith, N. V., Phys. Rev. Lett. 61, 2257 (1988).CrossRefGoogle Scholar
137Weller, D., Alvarado, S. F., Gudat, W., Schröder, K., and Campagna, M., Phys. Rev. Lett. 54, 1555 (1985).CrossRefGoogle Scholar
138Carbone, C. and Kisker, E., Solid State Commun. 65, 1107 (1988).CrossRefGoogle Scholar
139Kakehashi, Y., Phys. Rev. B31, 7482 (1985).CrossRefGoogle Scholar
140Taborelli, M., Allenspach, R., Boffa, G., and Landolt, M., Phys. Rev. Lett. 56, 2869 (1986).CrossRefGoogle Scholar
141Van Hove, M. A. and Tong, S. Y., Surface Crystallography (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1979).Google Scholar
142 For an overview of spin-polarized electron spectroscopy techniques see, for example, Polarized Electrons in Surface Physics, edited by Feder, R. (World Scientific, Singapore, 1985).Google Scholar
143Pierce, D. T., Celotta, R. J., Unguris, J., and Siegmann, H. C., Phys. Rev. B 26, 2566 (1982).CrossRefGoogle Scholar
144Alvarado, S. F., Campagna, M., and Hopster, H., Phys. Rev. Lett. 48, 51 (1982).CrossRefGoogle Scholar
145Dürr, W., Taborelli, M., Paul, O., Germar, R., Gudat, W., Pescia, D., and Landolt, M., Phys. Rev. Lett. 62, 206 (1989).CrossRefGoogle Scholar
146 See the article by Gradmann, U. and Alvarado, S. F. in Ref. 141.Google Scholar
147Pierce, D. T., Celotta, R. J., Wang, G-C., Unertl, W. N., Galejs, A., Kuyatt, C. E., and Mielczarek, S. R., Rev. Sci. Instrum. 51, 478 (1980).CrossRefGoogle Scholar
148Penn, D. R., Apell, S. P., and Girvin, S. M., Phys. Rev. B32, 7753 (1985).CrossRefGoogle Scholar
149Abraham, D. L. and Hopster, H., Phys. Rev. Lett. 58, 1352 (1987).CrossRefGoogle Scholar
150Mauri, D., Scholl, D., Siegmann, H. C., and Kay, E., Phys. Rev. Lett. 62, 1900 (1989).CrossRefGoogle Scholar
151Venus, A. and Kirscher, J., Phys. Rev. B37, 2199 (1988); Y. U. Idzerda, D. M. Lind, D. A. Papaconstantopoulos, G. A. Prinz, B. T. Jonker, and J. J. Krebs, Phys. Rev. Lett. 61, 1222 (1988); D. L. Abraham and H. H. Hopster, Phys. Rev. B62, 1157 (1989).CrossRefGoogle Scholar
152Abraham, D. L., Ph.D. Thesis, University of California, Irvine, CA (1989) (unpublished research).Google Scholar
153Onellion, M., Hart, M. W., Dunning, F. B., and Walters, G. K., Phys. Rev. Lett. 52, 380 (1984).CrossRefGoogle Scholar
154Rau, C., Schneider, C., Xing, G., and Jamison, K., Phys. Rev. Lett. 57, 3221 (1986).CrossRefGoogle Scholar
155Gidley, D. W., Köymen, A. R., and Capehart, T. W., Phys. Rev. Lett. 49, 1779 (1982).CrossRefGoogle Scholar
156Unguris, J., Pierce, D. T., and Celotta, R. J., Rev. Sci. Instrum. 57, 1314 (1986).CrossRefGoogle Scholar
157Hembree, G. G., Unguris, J., Celotta, R. J., and Pierce, D. T., Scanning Microscopy Supplement 1, 229 (1987).Google Scholar
158Pierce, D. T., Unguris, J., and Celotta, R. J., Mater. Res. Soc. Bull. 13, 19 (1988).CrossRefGoogle Scholar
159Scheinfein, M. R., Pierce, D. T., Unguris, J., McClelland, J. J., Celotta, R. J., and Kelley, M. H., Rev. Sci. Instrum. 60, 1 (1989).CrossRefGoogle Scholar
160Pierce, D. T., Scheinfein, M. R., Unguris, J., and Celotta, R. J., in Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers (Proc. Mater. Res. Soc. Symp.), edited by Jonker, B. T., Marinero, E. E., and Heremans, J. P. (Materials Research Society, Pittsburgh, PA, 1989), Vol. 151, p. 49.Google Scholar
161Joy, D. C. and Jacubovics, J. P., J. Phys. D2, 1367 (1969).Google Scholar
162Tonomura, A., Matsuda, T., Endo, J., Arii, T., and Mihama, K., Phys. Rev. Lett. 44, 1430 (1980).CrossRefGoogle Scholar
163Dekkers, N. H. and deLang, H., Optik 41, 452 (1974).Google Scholar
164Chapman, J. N. and Morrison, G. R., J. Magn. Magn. Mat. 35, 254 (1983).CrossRefGoogle Scholar
165Tsuno, K., Rev. Solid State Sci. 2, no. 4, 623 (1988).Google Scholar
166Pierce, D. T., Physica Scripta 38, 291 (1988).CrossRefGoogle Scholar
167Martin, Y., Rugar, D., and Wiskramasinghe, H. K., Appl. Phys. Lett. 52, 244 (1988).CrossRefGoogle Scholar
168Hartmann, U., J. Appl. Phys. 64, 1561 (1988).CrossRefGoogle Scholar
169 For recent reviews see, for instance, the various chapters in Interfaces, Superlattices and Thin Films (Proc. Mater. Res. Soc. Symp.), edited by Dow, J. D. and Schuller, I. K. (Materials Research Society, Pittsburgh, PA, 1987), Vol. 77.Google Scholar
170 See, for instance, McWhan, D. B., chapter in Ref. 169.Google Scholar
171 See, for instance, Spiller, E., chapter in Ref. 169.Google Scholar
172 See, for instance, various articles in Multilayers: Synthesis, Properties and Non-Electronic Application (Proc. Mater. Res. Soc. Symp.), edited by Barbee, T. W., Jr., Spaepen, F., and Greer, L. (Materials Research Society, Pittsburgh, PA, 1988), Vol. 103.Google Scholar
173 See, for instance, Locquet, J. P., Neerink, D., Sevenhans, W., Bruynseraede, Y., Homma, H., and Schuller, I. K., chapter in Ref. 172, p. 211.Google Scholar
174Schuller, I. K., Bruynseraede, Y., Fullerton, E., and Vanderstraeten, H. (to be published).Google Scholar
175Rhyne, J. J., Erwin, R. W., Borchers, J., Salamon, M. B., Du, R., and Flynn, C. P., Physica B159, 111 (1989).CrossRefGoogle Scholar
176Felcher, G. P., Hilleke, R. O., Crawford, R. K., Hanmann, J., Kleb, R., and Ostowski, G., Rev. Sci. Instrum. 58, 609 (1987).CrossRefGoogle Scholar
177Parkin, S. S. P., Sigsbee, R., Felici, R., and Felcher, G. P., Appl. Phys. Lett. 48, 604 (1986).CrossRefGoogle Scholar
178Toney, M. F., Huang, T. C., Brennan, S., and Rek, Z., J. Mater. Res. 3, 351 (1988).CrossRefGoogle Scholar
179Parkin, S. S. P., Deline, V., Hilleke, R., and Felcher, G. P., private communication and submitted to Phys. Rev. B.Google Scholar
180Bland, J. A. C. and Willis, R. F., in Thin Film Growth Techniques for Low-Dimensional Structures, edited by Farrow, R. F. C., Parkin, S. S. P., Dobson, P. J., Neave, J. H., and Arrott, A. S., NATO ASI Series B (Plenum, New York, 1987), Vol. 163, p. 405.CrossRefGoogle Scholar
181Zabel, H. (private communication).Google Scholar
182Eberhardt, W. and Fadley, C. S., “Summary of the Workshop on New Opportunities in Surface Science at the Advanced Light Source,” Lawrence Berkeley Laboratory Publication 5215, September 1988.Google Scholar
183Brau, C. A., Science 239, 1115 (1988).CrossRefGoogle Scholar
184Free Electron Laser Applications in the Ultraviolet (Optical Society of America, Washington, DC, 1988).Google Scholar
185 See Bader, S. D., in Ref. 184, p. 20.Google Scholar
186Bader, S. D., in Proc. of the First Users Meeting for the Advance Photon Source, Argonne National Laboratory, APS-CP-1, November 1986.Google Scholar
187Sinkovic, B., Hermsmeier, B., and Fadley, C. S., Phys. Rev. Lett. 55, 1227 (1985).CrossRefGoogle Scholar
188Marra, W. C., Eisenberger, P., and Cho, A. Y., J. Appl. Phys. 50, 6927 (1979); W. C. Marra, P. H. Fuoss, and P. Eisenberger, Phys. Rev. Lett. 49, 1169 (1982).CrossRefGoogle Scholar
189Gibbs, D., Moncton, D. E., D'Amico, K. L., Bohr, J., and Grier, B. H., Phys. Rev. Lett. 55, 234 (1985).CrossRefGoogle Scholar
190Vettier, C., McWhan, D. B., Gyorgy, E. M., Kwo, J. R., Buntschuh, B. M., and Batterman, B. W., Phys. Rev. Lett. 56, 757 (1985).CrossRefGoogle Scholar
191Blume, M., J. Appl. Phys. 57, 3615 (1985).CrossRefGoogle Scholar
192Rogers, D. J., Chapman, J. N., Bernards, J. P. C., and Luitjens, S. B., IEEE Trans. Mag. MAG–25, 4180 (1989); K. Hono and D. E. Laughlin, J. Magn. Magn. Mater. 80, L137 (1989).CrossRefGoogle Scholar
193Lin, T., Alani, R., and Lambeth, D. N., J. Magn. Magn. Mater. 78, 213 (1989).CrossRefGoogle Scholar
194Christner, J. A., Ranjan, R., Peterson, R. L., and Lee, J. I., J. Appl. Phys. 63, 3260 (1988).CrossRefGoogle Scholar
195Natarajan, B. R. and Murdock, E. S., IEEE Trans. Mag. MAG–24, 2724 (1988).CrossRefGoogle Scholar
196Zeper, W. B., Greidanus, F. J. A. M., Carcia, P. F., and Fincher, C. R., J. Appl. Phys. 65, 4971 (1989).CrossRefGoogle Scholar
197Cain, W. C., Markham, D. C., and Kryder, M. H., IEEE Trans. Mag. MAG–25, 3695 (1989).CrossRefGoogle Scholar
198Cadieu, F. J., Hedge, H., and Chen, K., IEEE Trans. Mag. MAG–25, 3788 (1989).CrossRefGoogle Scholar
199Wallace, W. E., Progress in Solid State Chem. 16, 127 (1985).CrossRefGoogle Scholar
200Bagno, P., Jepsen, O., and Gunnarson, O., Phys. Rev. Lett. 40, 1997 (1989).Google Scholar
201Liu, C. and Bader, S. D., Phys. Rev. B41, 553 (1990).CrossRefGoogle Scholar
202Mauri, D., Scholl, D., Siegmann, H. C., and Kay, E., Phys. Rev. Lett. 61, 758 (1988).CrossRefGoogle Scholar
203Rado, G. T., Bull. Am. Phys. Soc. 2, 127 (1957).Google Scholar
204Mills, D. L. and Maradudin, A. A., J. Phys. Chem. Solids 28, 1855 (1967).CrossRefGoogle Scholar
205Grünberg, P. and Mika, K., Phys. Rev. B27, 2955 (1983); K. Mika and P. Grunberg, Phys. Rev. B 31, 4465 (1985).CrossRefGoogle Scholar
206Grimsditch, M., Khan, M. R., Kueny, A., and Schuller, I. K., Phys. Rev. Lett. 51, 498 (1983).CrossRefGoogle Scholar
207Morrison, A., Kang, M. H., and Mele, E. J., Phys. Rev. B39, 1575 (1989).CrossRefGoogle Scholar
208Arrott, A. S., Heinrich, B., and Aharoni, A., IEEE Trans. Magn. MAG–15, 1228 (1979).CrossRefGoogle Scholar
209Vlaming, R. and van den Berg, H. A. M., J. Appl. Phys. 63, 4330 (1988).CrossRefGoogle Scholar
210Yafet, Y. and Gyorgy, E. M., Phys. Rev. B38, 9145 (1988).CrossRefGoogle Scholar
211Webb, B. C. and Schultz, S., IEEE Trans. Mag. MAG–24, 3006 (1988).CrossRefGoogle Scholar
212Kubo, O., Ido, T., Yokoyama, H., and Koike, Y., J. Appl. Phys. 57 4280 (1985).CrossRefGoogle Scholar
213Victora, R. H., J. Appl. Phys. 63, 3423 (1988); Phys. Rev. Lett. 63, 457 (1989).CrossRefGoogle Scholar
214Berkowitz, A. E., Parker, F. E., Hall, E. L., and Podolsky, G., IEEE Trans. Mag. MAG–24, 2871 (1988). 457 (1989).CrossRefGoogle Scholar