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Structure of layered WSe2 thin films with ultralow thermal conductivity

Published online by Cambridge University Press:  31 January 2011

Seongwon Kim ,
Jian Min Zuo ,
Ngoc T. Nguyen ,
David C. Johnson  and
David G. Cahill
Seongwon Kim
Affiliation:
Department of Material Science and Engineering and F. Seitz Materials Research Laboratory, University of Illinois at Urbana–Champaign, Urbana, Illinois 61801
Jian Min Zuo*
Affiliation:
Department of Material Science and Engineering and F. Seitz Materials Research Laboratory, University of Illinois at Urbana–Champaign, Urbana, Illinois 61801
Ngoc T. Nguyen
Affiliation:
Department of Chemistry, University of Oregon, Eugene, Oregon 97403
David C. Johnson
Affiliation:
Department of Chemistry, University of Oregon, Eugene, Oregon 97403
David G. Cahill
Affiliation:
Department of Material Science and Engineering and F. Seitz Materials Research Laboratory, University of Illinois at Urbana–Champaign, Urbana, Illinois 61801
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Crystallographic ordering and defects in WSe2 thin films with ultralow thermal conductivity are characterized by electron imaging and diffraction in cross-sectional geometry. The results show that the film consists of oriented, coherent crystallites that are a few nanometers in diameter. Two films of different thickness with different thermal conductivity are compared. We show that the film with a lower thermal conductivity is characterized by less coherent crystallites with a greater degree of misorientation.

Keywords

NanostructureThermal conductivityTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 23 , Issue 4 , April 2008 , pp. 1064 - 1067
Copyright
Copyright © Materials Research Society 2008

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References

REFERENCES

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