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The structure of carbon in chemically vapor deposited SiC monofilaments
Published online by Cambridge University Press: 31 January 2011
Abstract
The microstructures of carbon-rich regions in chemically vapor deposited SCS-6 SiC fibers have been studied by electron diffraction and high resolution transmission electron microscopy. The microstructures of the carbon in the substrate filament and the outer coating layers of the fiber are consistent with different distributions of Oberlin's model of Basic Structural Units (BSUs)1 while that of the inner substrate coating is consistent with turbostratic carbon (TC).
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References
1Oberlin, A., in Chemistry and Physics of Carbon, edited by Thrower, P. A. (Marcel Dekker, New York, 1989), Vol. 21.Google Scholar
2McElman, J. A., in Engineering Materials Handbook (ASM INTERNATIONAL, Cleveland, OH, 1987), Vol. 1.Google Scholar
4Ning, X. J. and Pirouz, P., “The Microstructure of SCS-6 Fibers” (1990, in preparation).CrossRefGoogle Scholar
5Pirouz, P., Morscher, G., and Chung, J., in Surfaces and Interfaces of Ceramic Materials, edited by Dufour, L. (Kluwers Academic Publishers, 1989), pp. 737–760.CrossRefGoogle Scholar
6Bokros, J. C., in Chemistry and Physics of Carbon, edited by Walker, P. L. (Marcel Dekker, New York, 1969), Vol. 5.Google Scholar
8Holstein, W. L., Moorehead, R. D., Poppa, H., and Bouart, M., in Chemistry and Physics of Carbon, edited by Thrower, P. A. (Marcel Dekker, New York, 1985), Vol. 18.Google Scholar
10Ruland, W., in Chemistry and Physics of Carbon, edited by Walker, P. L. (Marcel Dekker, New York, 1968), Vol. 4.Google Scholar
11Maire, J. and Mering, J., in Chemistry and Physics of Carbon, edited by Walker, P. L. (Marcel Dekker, New York, 1970), Vol. 6.Google Scholar
13Cullity, B. D., Elements ofX-Ray Diffraction, edited by Cohen, M., 2nd ed. (Addison-Wesley Publishing Co., Inc., New York, 1978).Google Scholar
14Hirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W., and Whelan, M. J., Electron Microscopy of Thin Crystals, 2nd rev. ed. (Robert E. Krieger Publishing Co., New York, 1977).Google Scholar
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