Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-24T17:26:27.961Z Has data issue: false hasContentIssue false
  • English
  • Français

The scanning electron acoustic microscopy investigation on ferroic materials under local stress

Published online by Cambridge University Press:  31 January 2011

Hongzhang Song ,
Yongxiang Li ,
Kunyu Zhao ,
Huarong Zeng ,
Guorong Li  and
Qingrui Yin
Hongzhang Song*
Affiliation:
State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
Qingrui Yin
Affiliation:
State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
*
a) Address all correspondence to this author. e-mail: [email protected]
Get access

Abstract

In this paper, the responses in the microregion of three ferroic-type materials, such as ferroelectric single crystals (PMN-PT and BaTiO3), ferromagnetic alloy (Fe81Ga19), and ferroelastic alloy (Ni53Mn24Ga23), to local stress induced by Vickers indentations were studied using scanning electron-acoustic microscopy (SEAM), a powerful technique for nondestructive investigation of the microstructure of materials. The responses of ferroelectric domains, magnetic domains, and ferroelastic domains to local stress were successfully observed. These responses possess three major features including the plastic deformation underneath the indenter, the extension of microcracks induced by indentation, and the formation of new lamellar domains within the matrix domain structure. In addition, by using the unique ability of SEAM to image layer by layer, the distributions of residual stress at different depths were obtained. The generation mechanisms of the electron acoustic signals of ferroelectric domains, magnetic domains, and ferroelastic domains are discussed.

Keywords

FerroelectricFerromagneticMicrostructure
Type
Outstanding Symposium Papers
Information
Journal of Materials Research , Volume 24 , Issue 7 , July 2009 , pp. 2173 - 2178
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Busche, M.J. and Hsia, K.J.: Fracture and domain switching by indentation in barium titanate single crystal. Scr. Mater. 44, 207 (2001).CrossRefGoogle Scholar
2Fang, F. and Yang, W.: Indentation-induced cracking and 90° domain switching pattern in barium titanate ferroelectric single crystals under different poling. Mater. Lett. 57, 198 (2002).CrossRefGoogle Scholar
3Wang, R.M., Chu, W.Y., Su, Y.J., Li, J.X., and Qiao, L.J.: In situ observation of relativity between domain and indentation crack propagating in barium titanate single crystal. Mater. Sci. Eng., B 135, 141 (2006).CrossRefGoogle Scholar
4Chu, R., Xu, Z., Li, G., Zeng, H., Yu, H., Luo, H., and Yin, Q.: Ultrahigh piezoelectric response perpendicular to special cleavage plane in BaTiO3 single crystals. Appl. Phys. Lett. 86, 012905 (2005).CrossRefGoogle Scholar
5Liu, D., Chelf, M., and White, K.W.: Indentation plasticity of barium titanate single crystals: Dislocation influence on ferroelectric domain walls. Acta Mater. 54, 4525 (2006).CrossRefGoogle Scholar
6Li, F-X., Li, S., and Fang, D-N.: Domain switching in ferroelectric single crystal/ceramics under electromechanical loading. Mater. Sci. Eng., B 120, 119 (2005).CrossRefGoogle Scholar
7Shang, J.K. and Tan, X.: Indentation-induced domain switching in PMN-PT crystal. Acta Mater. 49, 2993 (2001).CrossRefGoogle Scholar
8Wu, T-W. and Fromer, J.: Micro-indentation and scanning-probe microscopy to assess multilayer magnetic film damage. J. Magn. Magn. Mater. 219, 142 (2000).CrossRefGoogle Scholar
9Takenoshita, H. and Tabuchi, M.: Nondestructive internal observation and distribution of potential with bias application of npn Si darlington transistor chip using electron-acoustic microscopy. Jpn. J. Appl. Phys. 32, 2521 (1993).Google Scholar
10Zhang, B.Y., Jiang, F.M., Yang, Y., Yin, Q.R., and Kojima, S.: Electron-acoustic imaging of BaTiO3 single crystals. J. Appl. Phys. 80, 1916 (1996).CrossRefGoogle Scholar
11Yin, Q.R., Zeng, H.R., Yu, H.F., and Li, G.R.: Near-field acoustic and piezoresponse microscopy of domain structures in ferroelectric material. J. Mater. Sci. 41, 259 (2006).CrossRefGoogle Scholar
12Song, H.Z., Li, Y.X., Zeng, J.T., Li, G.R., and Yin, Q.R.: Observation of magnetic-domain structure in Terfenol-D by scanning electron acoustic microscopy. J. Magn. Magn. Mater. 320, 978 (2008).CrossRefGoogle Scholar
13Zhang, B.Y., Jiang, F.M., Shi, Y., and Yin, Q.R.: Scanning electronacoustic imaging of residual stress distributions in aluminum metal and ZrSiO4 multiphase ceramics. Appl. Phys. Lett. 70, 589 (1997).CrossRefGoogle Scholar
14Balk, L.J.: Scanning electron acoustic microscopy. Adv. Electronics Electron Phys. 71, 1 (1988).CrossRefGoogle Scholar
15Song, H.Z., Li, Y.X., Zhao, K.Y., Zeng, H.R., Hui, S.X., Li, G.R., and Yin, Q.R.: Contrast mechanism of magnetic domains in electronacoustic imaging. J. Appl. Phys. 104, 094913 (2008).CrossRefGoogle Scholar
16Chang, T.S.: Domain structures of SrTiO3 under uniaxial stresses. J. Appl. Phys. 43, 3591 (1972).CrossRefGoogle Scholar
17Kholkin, A.L., Shvartsman, V.V., Emelyanov, A.Yu., Poyato, R., Calzada, M.L., and Pardo, L.: Stress-induced suppression of piezoelectric properties in PbTiO3: La thin films via scanning force microscopy. Appl. Phys. Lett. 82, 2127 (2003).CrossRefGoogle Scholar
18Yang, W. and Zhu, T.: Switch-toughening of ferroelectrics subjected to electric fields. J. Mech. Phys. Solids 46, 291 (1998).CrossRefGoogle Scholar
19Qian, M-L., Wu, X-M., Yin, Q-R., Zhang, B-Y., and Cantrell, J.H.: Scanning electron acoustic microscopy of electric domains in ferroelectric materials. J. Mater. Res. 14, 3096 (1999).CrossRefGoogle Scholar
20Cazaux, J.: Some consideration on the electric field induced in insulators by electron bombardment. J. Appl. Phys. 59, 1418 (1986).CrossRefGoogle Scholar
21Ma, Y-Q., Jiang, C-B., Li, Y., Xu, H-B., Wang, C-P., and Liu, X-J.: Microstructure and high-temperature shape-memory effect in Ni54Mn25Ga21 alloy. Trans. Nonferrous Met. Soc. China 16, 502 (2006).CrossRefGoogle Scholar
22Davies, D.G. and Howie, A.: Applications of scanning electron acoustic microscopy. Inst. Phys. Conf. Ser. 68, 467 (1983).Google Scholar