Article contents
Reply to the comments of O. Jørgensen et al.
Published online by Cambridge University Press: 31 January 2011
Abstract
Large scale yielding (LSY), in general, has a profound influence on the fracture toughness of metal/dielectric interfaces. For thin metal film/dielectric systems exhibiting “weak” bonding, small-scale yielding (SSY) prevails due to local plastic dissipation intrinsic to crack growth and the high yield strength of metal thin films. For systems involving low yield strength materials and strong interfaces, a more detailed LSY methodology needs to be developed.
- Type
- Articles
- Information
- Copyright
- Copyright © Materials Research Society 1996
References
REFERENCES
- 2
- Cited by