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Relation between tolerance factor and Tc in Aurivillius compounds

Published online by Cambridge University Press:  31 January 2011

Donají Y. Suárez ,
Ian M. Reaney  and
William E. Lee
Donají Y. Suárez
Affiliation:
Department of Engineering Materials, University of Sheffield, Mappin St, Sheffield, S1 3JD, United Kingdom
Ian M. Reaney
Affiliation:
Department of Engineering Materials, University of Sheffield, Mappin St, Sheffield, S1 3JD, United Kingdom
William E. Lee
Affiliation:
Department of Engineering Materials, University of Sheffield, Mappin St, Sheffield, S1 3JD, United Kingdom
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Abstract

The structures and microstructures of a range of Aurivillius phases were investigated by transmission electron microscopy. Systematic rows of superlattice reflections arising from tilting of octahedra around the c axis were identified, and their intensities at room temperature were shown to diminish as the tolerance factor (t) of the perovskite blocks increased. For compounds with t's approaching 1, no superlattice reflections were observed. the paraelectric-to-ferroelectric phase transition temperature (Tc) was monitored through permittivity measurements as a function of temperature, and Tc was also shown to decrease as t increased. Consequently, the onset of octahedral tilting and Tc appeared to be strongly related Aurivillius phases. Planar defects arising from the structural phase transitions and from stacking irregularities were also discussed.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 11 , November 2001 , pp. 3139 - 3149
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1.Aurivillius, B., Arki Kemi 59, 499 (1949).Google Scholar
2.Newnham, R.E., Wolfe, R.W., and Dorrian, J.F., Mater. Res. Bull. 6, 1029 (1971).CrossRefGoogle Scholar
3.Dorrian, J.F., Newnham, R.E., and Smith, D., Ferroelectrics 3, 17 (1971).CrossRefGoogle Scholar
4.Yi, I.S. and Miyayama, M., J. Ceram. Soc. Japan 106, 285 (1988).CrossRefGoogle Scholar
5.Kikuchi, T., J. Less-Comm. Met. 48, 319 (1976).CrossRefGoogle Scholar
6.Reaney, I.M., Roulin, M., Shulman, H.S., and Damjanovic, D., Characterisation of the Perovskite Layer Structure, SrBi8Ti7O27, Conf. Proc., Electroceram IV, 1994, p. 131.Google Scholar
7.Frit, B. and Mercurio, J.P., J. Alloys Compd. 188, 27 (1992).CrossRefGoogle Scholar
8.Withers, R.L., Thompson, J.G., and Rae, A.D., J. Solid State. Chem. 94, 404 (1991).CrossRefGoogle Scholar
9.Subbarao, E.C., Integr. Ferroelectr. 12, 33 (1996).CrossRefGoogle Scholar
10.Shimakawa, Y., Kubo, Y., Nakagawa, Y., Goto, S., Kamiyama, T., Asano, H., and Izumi, F., Phys. Rev. B 61, 6559, 2001.CrossRefGoogle Scholar
11.Shannon, R.D., Acta Crystallogr. A 32, 751 (1976).CrossRefGoogle Scholar
12.Irie, H., Miyayama, M., and Kudo, T., J. Am. Ceram. Soc. 83, 2699 (2000).CrossRefGoogle Scholar
13.Reaney, I.M., Colla, E., and Setter, N., Japan J. Appl. Phys. 33, 3984 (1994).CrossRefGoogle Scholar
14.Glazer, A.M., Acta Crystallogr. B 28, 3384 (1972).CrossRefGoogle Scholar
15.Reaney, I.M., Ubic, R., Breeze, J., Alford, N., Iddles, D., Cannell, D., and Price, T., Philos. Mag. (in press).Google Scholar
16.Lines, M.E. and Glass, A.M., Principles and Applications of Fer-roelectrics and Related Materials (Oxford University Press, Ox-ford, United Kingdom, 1977), p. 206.Google Scholar
17.Reaney, I.M., Roulin, M., Shulman, H.S., and Setter, N., Ferroelec-trics 165, 295 (1995).CrossRefGoogle Scholar
18.Damjanovic, D. and Reaney, I.M., J. Appl. Phys. 80, 4223 (1996).Google Scholar
19.Matsui, T., Shigematsu, H., Arita, Y., Hanajiri, Y., Nakamitsu, N., and Nagasaki, T., J. Nucl. Mater. 247, 72 (1997).CrossRefGoogle Scholar
20.Noguchi, N., Miyayama, M., and Kudo, T., in Proc. Int. Symp. App. Ferro. 2000, Hawaii (in press).Google Scholar
21.West, A.R., Basic Solid State Chemistry (John Wiley & Sons, Chichester, 1999) United Kingdom, p. 145.Google Scholar