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Pyrochlore-to-perovskite transformation during rapid heating of sol-gel (Pb,La)TiO3 thin films

Published online by Cambridge University Press:  31 January 2011

Miguel Algueró ,
M. Lourdes Calzada  and
Lorena Pardo
Miguel Algueró
Affiliation:
Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Cientificas, Cantoblanco 28049, Madrid, Spain
M. Lourdes Calzada
Affiliation:
Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Cientificas, Cantoblanco 28049, Madrid, Spain
Lorena Pardo
Affiliation:
Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Cientificas, Cantoblanco 28049, Madrid, Spain
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Abstract

Phases appearing in lanthanum-modified lead titanate thin films prepared by a diol-based sol-gel method and crystallized by rapid heating were studied. The results clearly indicate that a phase transformation from a pyrochlore structure to the perovskite phase occurs in Pb-deficient films during the thermal treatment, which involves a heating rate higher than 500 °C min−1. The rate of this transformation is a function of the lead content of the films, decreasing as lead volatilizes. Temperatures higher than 650 °C or soak times longer than 2 h make possible the complete pyrochlore-to-perovskite transformation without any lead excess in the films.

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Articles
Information
Journal of Materials Research , Volume 14 , Issue 11 , November 1999 , pp. 4302 - 4306
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1.Algueró, M., Calzada, M.L., and Pardo, L., in Proceedings of Electroceramics V, Aveiro (Portugal) September 2nd to 4th, 1996, edited by Baptista, J.L., Labrincha, J.A., and Vilarinho, P.M. (University of Aveiro, Portugal, 1996), p. 403.Google Scholar
2.Algueró, M., Calzada, M.L., and Pardo, L., Appl. Phys. A 68, 583 (1999).Google Scholar
3.Ricote, J., Snoeck, E., Coratger, R., and Pardo, L., J. Phys. Chem. Solids 59, 151 (1998).CrossRefGoogle Scholar
4.Reaney, I.M., Brooks, K., Klissurska, R., Pawlaczyk, C., and Setter, N., J. Am. Ceram. Soc. 77, 1209 (1994).CrossRefGoogle Scholar
5.Carim, A.H., Tuttle, B.A., Doughty, D.H., and Martinez, S.L., J. Am. Ceram. Soc. 74, 1455 (1991).CrossRefGoogle Scholar
6.Seifert, A., Lange, F., and Speck, J., J. Mater. Res. 10, 1455 (1995).CrossRefGoogle Scholar
7.Lakeman, C.D.E, Xu, Z., and Payne, D., J. Mater. Res. 10, 2042 (1995).CrossRefGoogle Scholar
8.Tuttle, B.A., Headley, T.J., Bunker, B.C., Schwartz, R.W., Zender, T.J., Hernández, C.L., Goodnow, D.C., Tissot, R.J., and Michael, J., J. Mater. Res. 7, 1876 (1992).CrossRefGoogle Scholar
9.Calzada, M.L., Martín, M.J., Ramos, P., Mendiola, J., Sirera, R., da Silva, M.F., and Soares, J.C., J. Phys. Chem. Solids 58, 1033 (1997).CrossRefGoogle Scholar
10.Jones, R.E. Jr, Zurcher, P., Chu, P., Taylor, D.J., Lii, Y.T., Jiang, B., Maniar, P.D., and Gillispie, S.J., Microelectron. Eng. 29, 3 (1995).CrossRefGoogle Scholar
11.Kingon, A.I., Streiffer, S.K., Basceri, C., and Summefelt, S.R., MRS Bull. 21(7), 46 (1996).CrossRefGoogle Scholar
12.Kulwicki, B.M., Amin, A., Beratan, H.R., and Hanson, C.M., Proceedings of 8th IEEE ISAF, Greenville, SC, August 30th to September 2nd 1992, edited by Liu, M., Safari, A., Kingon, A., and Haertling, G. (IEEE, 1992), p. 1.Google Scholar
13.Polla, D.L. and Francis, L.E., MRS Bull. 21(7), 59 (1996).CrossRefGoogle Scholar
14.Chen, J., Udayakumar, K.R., Brooks, K.G., and Cross, L.E., J. Appl. Phys. 71, 4465 (1992).CrossRefGoogle Scholar
15.Hu, H., Peng, C.J., and Krupanidhi, S.B., Thin Solid Films 223, 327 (1993).CrossRefGoogle Scholar
16.Carmona, F., Calzada, M.L., Román, E., Sirera, R., and Mendiola, J., Thin Solid Films 279, 70 (1996).CrossRefGoogle Scholar
17.Dang, E.K.F and Gooding, R.J., Phys. Rev. Lett. 74, 3848 (1995).CrossRefGoogle Scholar
18.Brooks, K.G., Reaney, I.M., Klissurska, R., Huang, Y., Bursill, L., and Setter, N., J. Mater. Res. 9, 2540 (1994).CrossRefGoogle Scholar
19.Calzada, M.L., Algueró, M., and Pardo, L., J. Sol-Gel Sci. Tech. 13, 837 (1998).CrossRefGoogle Scholar
20.Holman, R.L. and Fulrath, R.M., J. Appl. Phys. 44, 5227 (1973).CrossRefGoogle Scholar