Hostname: page-component-745bb68f8f-d8cs5 Total loading time: 0 Render date: 2025-01-11T13:23:45.497Z Has data issue: false hasContentIssue false
  • English
  • Français

Preparation and size evaluation of nanometer gadolinium powder

Published online by Cambridge University Press:  31 January 2011

Y. Z. Shao ,
C. H. Shek  and
J. K. L. Lai
Y. Z. Shao
Affiliation:
Department of Physics, Zhongshan University, Guangzhou 510275, People's Republic of China
C. H. Shek
Affiliation:
Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong
J. K. L. Lai
Affiliation:
Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong
Get access

Abstract

Nanometer-size gadolinium powders (nm-Gd) have been prepared by means of evaporation condensation of Gd atoms within inert gas atmosphere. Microscopic analyses, based on measurements of small angle x-ray scattering (SAXS), x-ray diffraction (XRD), Raman scattering spectrum (RSS), and observation with transmission electron microscope (TEM), have been carried out in order to evaluate the size and size distribution of the as-prepared nm-Gd powder. It turns out that the size distribution function of nm-Gd powder agrees very well with the distribution function of Rayleigh instead of logarithmic distribution. The mean size d of nm-Gd powders bears a linear relationship with the logarithm of the pressure p of the inert gas atmosphere as follows: d = a + b · ln p. A discussion concerning the influence of particle size of nm-Gd powder on nanostructured material parameters such as the size distribution, specific surface area, and the percentage of interface atoms have been given in detail.

Type
Articles
Information
Journal of Materials Research , Volume 13 , Issue 10 , October 1998 , pp. 2969 - 2974
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Suryanarayana, C., Int. Mater. Rev. 40, 41 (1995).CrossRefGoogle Scholar
2.Gleiter, H., Prog. Mater. Sci. 33, 223 (1989).CrossRefGoogle Scholar
3.Bennett, L. H., McMichael, R. D., Swartzendruber, L. J., and Shull, R. D., J. Magn. Magn. Mater. 104–107, 1094 (1992).CrossRefGoogle Scholar
4.McMichael, R. D., Ritter, J. J., and Shull, R. D., J. Appl. Phys. 73, 6946 (1993).CrossRefGoogle Scholar
5.Chen, R. Y., Patel, S., and Shaw, D. T., J. Magn. Magn. Mater. 134, 75 (1994).CrossRefGoogle Scholar
6.Shull, R. D., McMichael, R. D., and Ritter, J. J., Nanostructured Materials 2, 205 (1993).Google Scholar
7.X-rays Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., edited by Klug, H. P. and Alexander, L. E. (John Wiley & Sons, New York, 1974), p. 687.Google Scholar
8.Kostorz, G., Physical Metallurgy, 3rd ed., edited by Cahn, R. W. and Haasen, P. (North-Holland Publishing, Amsterdam, 1983), p. 829.Google Scholar
9.Jellinek, M. H., Ind. Eng. Chem. Anal. 18, 172 (1946).CrossRefGoogle Scholar
10.Porod, G., Small Angle X-rays Scattering, edited by Glatter, O. and Kratky, O. (Academic, London, 1982), p. 17.Google Scholar
11.Cardona, M., Light Scattering in Solids (Springer-Verlag, Berlin, 1981), Vol. 2, p. 80.Google Scholar
12.Eastman, J. A., in Multicomponent Ultrafine Microstructures, edited by McCandlish, L. E., Kear, B. H., Polk, D. E., and Siegel, R. W. (Mater. Res. Soc. Symp. Proc. 132, Pittsburgh, PA, 1989), p. 27.Google Scholar
13.Zhang, L. D. and Mu, J. M., Nano-materials Science (Liaolin Science & Technology Press, Shenyang, China, 1994), p. 21.Google Scholar