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Orientation transformation of Pb grains in 5Sn–95Pb/ 63Sn–37Pb composite flip-chip solder joints during electromigration test

Published online by Cambridge University Press:  31 January 2011

Ying-Ta Chiu ,
Kwang-Lung Lin  and
Yi-Shao Lai
Ying-Ta Chiu*
Affiliation:
Department of Materials Science and Engineering, and Frontier Material and Micro/Nano Science and Technology Center, National Cheng Kung University, Tainan 701, Taiwan
Kwang-Lung Lin
Affiliation:
Department of Materials Science and Engineering, and Frontier Material and Micro/Nano Science and Technology Center, National Cheng Kung University, Tainan 701, Taiwan
Yi-Shao Lai
Affiliation:
Central Labs, Advanced Semiconductor Engineering, Inc., Kaohsiung 811, Taiwan
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Microstructural evolution occurred in 5Sn–95Pb/63Sn–37Pb composite flip-chip solder bump during electromigration. Scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD) observations for 5Sn–95Pb/63Sn–37Pb composite flip-chip solder joints subjected to 5 kA/cm2 current stressing at 150 °C revealed a gradual orientation transformation of Pb grains from random textures toward (101) grains. We proposed that the combination of reducing the surface energy of Pb grain boundaries and resistance of the entire polycrystalline system are the driving force for the orientation transformation of Pb grains during an electromigration test.

Keywords

ElectromigrationPbSn
Type
Articles
Information
Journal of Materials Research , Volume 23 , Issue 7 , July 2008 , pp. 1877 - 1881
Copyright
Copyright © Materials Research Society 2008

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References

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