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A new approach to characterization of the transition temperatures of thin film NiTi shape memory alloys

Published online by Cambridge University Press:  03 March 2011

Nicholas W. Botterill ,
David M. Grant ,
Jianxin Zhang  and
Clive J. Roberts
Nicholas W. Botterill
Affiliation:
School of Mechanical, Materials, Manufacturing and Management, University of Nottingham, Nottingham NG7 2RD, United Kingdom
David M. Grant*
Affiliation:
School of Mechanical, Materials, Manufacturing and Management, University of Nottingham, Nottingham NG7 2RD, United Kingdom
Jianxin Zhang
Affiliation:
Laboratory of Biophysics and Surface Analysis, School of Pharmaceutical Science,University of Nottingham, Nottingham NG7 2RD, United Kingdom
Clive J. Roberts
Affiliation:
Laboratory of Biophysics and Surface Analysis, School of Pharmaceutical Science,University of Nottingham, Nottingham NG7 2RD, United Kingdom
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

A novel approach in determining the transition temperatures of NiTi shape memory alloys was investigated and compared with conventional techniques. The technique is based on microthemal analysis using a scanning thermal microscope (SThM). In particular, this method has the potential to allow the transformation temperatures of thin films to be investigated in situ. Thin film shape memory alloys have potential applications, such as microactuators, where conventional analysis techniques are either not directly applicable to such samples or are difficult to perform.

Keywords

Scanning thermal microscopy (SThM)Thin filmIntermetallic alloys
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 6 , June 2004 , pp. 1762 - 1767
Copyright
Copyright © Materials Research Society 2004

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References

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