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Microstructural characterization of YBaCuO thin films deposited by rf magnetron sputtering as a function of annealing conditions

Published online by Cambridge University Press:  31 January 2011

M. Ece ,
R.W. Vook  and
John P. Allen
M. Ece
Affiliation:
Physics Department, Syracuse University, 201 Physics Building, Syracuse, New York 13244–1130
R.W. Vook
Affiliation:
Physics Department, Syracuse University, 201 Physics Building, Syracuse, New York 13244–1130
John P. Allen
Affiliation:
CVC Products Inc., Rochester, New York 14603–1886
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Abstract

Thin films of Y1Ba2Cu3O7−x have been prepared on MgO, SrTiO3/Al2O3, and Al2O3 substrates by rf magnetron sputtering. A buffer layer of SrTiO3 was deposited on Al2O3 by flash evaporation. The as-deposited films on MgO and SrTiO

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 2 , February 1991 , pp. 252 - 263
Copyright
Copyright © Materials Research Society 1991

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