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The Meyer–Neldel rule in amorphous TiO2 films with different Fe content

Published online by Cambridge University Press:  03 July 2012

Diana Mardare ,
Abdullah Yildiz ,
Radu Apetrei ,
Petronela Rambu ,
Daniel Florea ,
Nicoleta Georgiana Gheorghe ,
Dan Macovei ,
Cristian Mihail Teodorescu  and
Dumitru Luca
Diana Mardare*
Affiliation:
Department of Physics, “Alexandru Ioan Cuza” University, Faculty of Physics, 700506-Iasi, Romania
Abdullah Yildiz
Affiliation:
Department of Energy Systems Engineering, Faculty of Engineering and Natural Sciences, Yıldırım Beyazıt University, 06030, Ankara, Turkey
Radu Apetrei
Affiliation:
“Alexandru Ioan Cuza” University, Faculty of Physics, 700506-Iasi, Romania
Petronela Rambu
Affiliation:
“Alexandru Ioan Cuza” University, Faculty of Physics, 700506-Iasi, Romania
Daniel Florea
Affiliation:
“Alexandru Ioan Cuza” University, Faculty of Physics, 700506-Iasi, Romania
Nicoleta Georgiana Gheorghe
Affiliation:
National Institute of Materials Physics, 077125-Magurele-Ilfov, Romania
Dan Macovei
Affiliation:
National Institute of Materials Physics, 077125-Magurele-Ilfov, Romania
Cristian Mihail Teodorescu
Affiliation:
National Institute of Materials Physics, 077125-Magurele-Ilfov, Romania
Dumitru Luca
Affiliation:
“Alexandru Ioan Cuza” University, Faculty of Physics, 700506-Iasi, Romania
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Amorphous titania thin films with increasing Fe content have been prepared by RF magnetron sputtering. X-ray absorption spectroscopy revealed modifications of both local structures/environment of the Ti and Fe atoms, with formation of phases containing amorphous material and a magnetite-like phase. The temperature dependence of the electrical conductivity of the films was investigated for temperatures higher than half of the Debye temperature (T > 391 K). It was found that the electrical conductivity in the amorphous Fe/TiO2 films obeys the Meyer–Neldel rule. The origin of this behavior is explained on the basis of the multiphonon-assisted hopping model.

Keywords

thin filmEXAFSelectrical properties
Type
Articles
Information
Journal of Materials Research , Volume 27 , Issue 17: Focus Issue: Oxide Semiconductors , 14 September 2012 , pp. 2271 - 2277
Copyright
Copyright © Materials Research Society 2012

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References

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