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Magnetoresistance, temporal evolution, and relaxation of the electrical resistivity in the re-entrant semiconducting La0.80Ba0.20CoO3 perovskite

Published online by Cambridge University Press:  31 January 2011

R. D. Sánchez ,
J. Mira ,
J. Rivas ,
M. P. Breijo  and
M. A. Señarís-Rodríguez
R. D. Sánchez
Affiliation:
Dpto. Física Aplicada, Universidad de Santiago de Compostela, 15706 Santiago de Compostela, Spain
J. Mira
Affiliation:
Dpto. Física Aplicada, Universidad de Santiago de Compostela, 15706 Santiago de Compostela, Spain
J. Rivas
Affiliation:
Dpto. Física Aplicada, Universidad de Santiago de Compostela, 15706 Santiago de Compostela, Spain
M. P. Breijo
Affiliation:
Dpto. Química Fundamental e Industrial, Universidad de A Coruña, 15071 A Coruña, Spain
M. A. Señarís-Rodríguez*
Affiliation:
Dpto. Química Fundamental e Industrial, Universidad de A Coruña, 15071 A Coruña, Spain
*
b)Address all correspondence to this author. e-mail: [email protected]
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Abstract

We report here a study on the electrical and magnetic properties of La1−xBaxCoO3 in the re-entrant semiconducting region (x = 0.20). We find that in this material: (i) the insulator-metal-insulator sequence is unstable and evolves toward a purely semiconducting behavior; the initial r versus T curve can be reinstated upon appropriate annealing treatments; (ii) there are relaxation effects that can be seen by changing the polarity of the electrodes; (iii) there is a negative magnetoresistance Δρ/ρ ∼ 2–3%, for a field as low as 9 kOe, especially at the metal-insulating transition temperatures; and (iv) there are important fluctuations in the electrical resistivity. Taking into account these experimental observations, we can interpret this material as an inhomogeneous system where two thermodynamic phases, one semiconducting and the other metallic and ferromagnetic, coexist, although they are crystallographically indistinguishable.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 6 , June 1999 , pp. 2533 - 2539
Copyright
Copyright © Materials Research Society 1999

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References

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