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Magnetic and electronic properties of M-Ba–Cu–O (M = Y, Er, Eu)

Published online by Cambridge University Press:  31 January 2011

H. Jenny ,
B. Walz ,
G. Leeman ,
V. Geiser ,
S. Jost ,
T. Frey  and
H.-J. Güntherodt
H. Jenny
Affiliation:
Institut für Physik, Universität Basel, Klingelbergstr. 82, CH-4056 Basel, Switzerland
B. Walz
Affiliation:
Institut für Physik, Universität Basel, Klingelbergstr. 82, CH-4056 Basel, Switzerland
G. Leeman
Affiliation:
Institut für Physik, Universität Basel, Klingelbergstr. 82, CH-4056 Basel, Switzerland
V. Geiser
Affiliation:
Institut für Physik, Universität Basel, Klingelbergstr. 82, CH-4056 Basel, Switzerland
S. Jost
Affiliation:
Institut für Physik, Universität Basel, Klingelbergstr. 82, CH-4056 Basel, Switzerland
T. Frey
Affiliation:
Institut für Physik, Universität Basel, Klingelbergstr. 82, CH-4056 Basel, Switzerland
H.-J. Güntherodt
Affiliation:
Institut für Physik, Universität Basel, Klingelbergstr. 82, CH-4056 Basel, Switzerland
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Abstract

Various high-Tc superconductors of the La–(Ba,Sr)–Cu–O and the M–Ba–Cu–O systems with M = Y, Er, and Eu have been prepared by the solid-state reaction method. Single-phase samples with no additional diffraction peaks as verified by x-ray diffraction (XRD) measurements have been obtained. Measurements of the electrical resistivity and of the magnetization showed sharp superconducting transitions with a width of 1 K. The measurements of the magnetic susceptibility have been extended above room temperature up to 770 K. There is clear evidence for the formation of a magnetic moment in all M–Ba–Cu–O samples. Monochromated x-ray photoelectron spectroscopy (MXPS) valence band and x-ray photoelectron spectroscopy (XPS) core level spectra have been measured on various samples at room temperature and at liquid nitrogen temperature.

Type
Articles
Information
Journal of Materials Research , Volume 2 , Issue 6 , December 1987 , pp. 775 - 778
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

1Bednorz, J. G. and Miiller, K. A., Z. Phys. B 64, 189 (1986).CrossRefGoogle Scholar
2Cava, R. J., Dover, R. B. van, Batlogg, B., and Rietman, E. A., Phys. Rev. Lett. 58, 408 (1987).CrossRefGoogle Scholar
3Wu, M. K., Ashburn, J. R., and Torng, C. J., Phys. Rev. Lett. 58, 908 (1987).CrossRefGoogle Scholar
4Chaudhari, P., Koch, R. H., Laibowitz, R. B., McGuire, T. R., and Gambino, R. J., Phys. Rev. Lett. 58, 2684 (1987).CrossRefGoogle Scholar
5Chu, C. W., Hor, P. H., Meng, R. L., Gao, L., Huang, Z. J., and Wang, Y. Q., Phys. Rev. Lett. 58, 405 (1987).CrossRefGoogle Scholar
6Capponi, J. J., Chaillout, C., Hewat, A. W., Lejay, P., Marezio, M., Nguyen, N., Raveau, B., Soubeyroux, J. L., Tholence, J. L., and Tour-nier, R., Europhys. Lett. 3, 1301 (1987).CrossRefGoogle Scholar
7Cava, R. J., Batlogg, B., Dover, R. B. van, Murphy, D. W., Sunshine, S., Siegrist, T., Remeika, J. P., Rietman, E. A., Zahurak, S., and Espinosa, G. P., Phys. Rev. Lett. 58, 1676 (1987).CrossRefGoogle Scholar
8Junod, A., Bezinge, A., Graf, T., Jorda, J. L., Muller, J., Antognazza, L., Cattani, D., Cors, J., Decroux, M., Fischer, O., M, Banovski, Gen-oud, P., Hoffman, L., Manuel, A. A., Peter, M., Walker, E., Frangois, M., and Yvon, K., Europhys. Lett. 4, 247 (1987).CrossRefGoogle Scholar
9Murphy, D. W., Sunshine, S., Dover, R. B. van, Cava, R. J., Batlogg, B., Zahurak, S. M., and Schneemeyer, L. F., Phys. Rev. Lett. 58, 1888 (1987).CrossRefGoogle Scholar
10Steiner, P., Kinsinger, V., Sander, I., Siegwart, B., Hiifner, S., and Politis, C., Z. Phys. B 67, 19 (1987).CrossRefGoogle Scholar
11Wertheim, G. K., Hiifner, S., Phys. Rev. Lett. 28, 1028 (1972).CrossRefGoogle Scholar
12Mattheiss, L. F., Phys. Rev. Lett. 58, 1028 (1987).CrossRefGoogle Scholar
13Romand, M., Roubin, M., and Deloume, J. P., J. Electron Spectr. 13, 229 (1978).CrossRefGoogle Scholar