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Influence of deformation inhomogeneity on the annealing behavior of drawn oxygen-free high conducting copper

Published online by Cambridge University Press:  23 January 2013

Daudi R. Waryoba*
Affiliation:
Department of Engineering, Penn State University - DuBois, Pennsylvania 15801
Primus V. Mtenga
Affiliation:
Department of Civil and Environmental Engineering, FAMU-FSU College of Engineering, Tallahassee, Florida 32310
Jagabanduhu Chakrabarty
Affiliation:
National High Magnetic Field Laboratory, Tallahassee, Florida 32310
Peter N. Kalu
Affiliation:
Department of Mechanical Engineering, FAMU-FSU College of Engineering, Tallahassee, Florida 32310; and National High Magnetic Field Laboratory, Tallahassee, Florida 32310
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Oxygen-free high conducting copper wires drawn to true strains of 2.3, 3.1, and 3.6 exhibit inhomogeneity in the form of three distinct concentric regimes: the inner core, the midsection, and the outer region. While the microtexture of the inner core was dominated by a strong <111> + weak <100> duplex fiber texture, the midsection and the outer region had a comparatively weaker texture. An upper bound plasticity modeling and the nanohardness measurement revealed that the midsection was the most strained region. Upon annealing at 170 °C, the 2.3-strained wire did not recrystallize, whereas the 3.1- and 3.6-strained wires exhibited partial recrystallization. For the 3.6 wire, the inner core was unrecrystallized, while the midsection and outer region recrystallized with strong <100> + weak <111> fiber texture. The recrystallized grains were classified as type “A” grains, which grew laterally with <100>//DD orientation, and type “B” grains, which generally grew axially with <111>//DD orientation.

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Articles
Copyright
Copyright © Materials Research Society 2013

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