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In-depth and ion image analysis of minor and trace constituents in V–Cr–Ti alloy welds

Published online by Cambridge University Press:  31 January 2011

Robert W. Odom  and
Martin L. Grossbeck
Robert W. Odom*
Affiliation:
Charles Evans / Associates, Redwood City, California 94063
Martin L. Grossbeck
Affiliation:
Oak Ridge National Laboratory, Metals and Ceramics Division, Oak Ridge, Tennessee 37831
*
a)Address all correspondence to this author.
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Abstract

This paper describes the application of dynamic secondary ion mass spectrometry (SIMS) to the study of the chemistry of welds in V–Cr–Ti alloys and presents preliminary data on the distribution of minor and trace elements (H, C, N, O, P, S, and C1) in welds produced by gas tungsten arc (GTA) and electron beam techniques. The motivation for this research is to develop techniques that determine correlations between the concentration and distribution of trace elements in alloy metal welds and the physical properties of the weld. To this end, quantitative SIMS techniques were developed for N, O, and S analysis in vanadium alloy welds using an ion implantation/relative sensitivity factor methodology. The data presented in this paper demonstrate that trace compositions and distributions of selected welds correlate, at least qualitatively, with such properties as microhardness and tensile elongation. These data support continuing these investigations to develop microanalysis methods that quantitatively correlate weld composition with mechanical properties.

Type
Articles
Information
Journal of Materials Research , Volume 11 , Issue 8 , August 1996 , pp. 1923 - 1933
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1.Kainuma, T., Iwao, N., Suzuki, T., and Watanabe, R., J. Nucl. Mater. 80, 939 (1979).CrossRefGoogle Scholar
2.Diercks, D. R. and Loomis, B. A., J. Nucl. Mater. 141–143, 1117 (1986).CrossRefGoogle Scholar
3.Eustice, A. L. and Carlson, G. N., Trans. AIME 221, 238 (1961).Google Scholar
4.Svenberg, R. C. and Buckman, R. W., Int. Metals Rev. 5/6, 223 (1980).Google Scholar
5.Buende, R., Fabritsiev, S., and Rybin, V., Fusion Eng. Design 16, 59 (1991).CrossRefGoogle Scholar
6.American Society for Metals Handbook, 9th ed., edited by Welding, Brazing, and Soldering, (American Society for Metals, Metals Park, OH, 1983), p. 827.Google Scholar
7.Secondary Ion Mass Spectrometry, edited by Vickerman, J.C., Brown, A., and Reed, N. M. (Clarendon Press, Oxford, 1989).Google Scholar
8.Blattner, R. J., in Microstructural Science, edited by Stevens, D. W.et al. (Elsevier, New York, 1980), Vol. 8.Google Scholar
9.Scanning Electron Microscopy and X-Ray Microanalysis, edited by Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Fiori, C., and Lifshin, E. (Plenum, New York, 1984).Google Scholar
10.Rasser, B., Renard, D., and Schuhmacher, M., in Secondary Ion Mass Spectrometry SIMS-IX, edited by Benninghoven, A., Nihei, Y., Shimizu, R., and Werner, H.W. (Wiley / Sons, New York, 1994).Google Scholar
11.Odom, R. W. and Hitzman, C.J., in Secondary Ion Mass Spectrom-etry SIMS-IX, edited by Benninghoven, A., Nihei, Y., Shimizu, R., and Werner, H.W. (Wiley / Sons, New York, 1994).Google Scholar
12.Odom, R. W., Appl. Spectrosc. Rev. 29 (1), 67 (1994).CrossRefGoogle Scholar
13.Kainuma, T.et al., J. Nucl. Mater. 80, 339 (1979).CrossRefGoogle Scholar
14.Wilson, R. G. and Brewer, G. R., Ion Beams and Their Applications to Ion Implantation (Wiley / Sons, New York, 1973).Google Scholar
15.Mayer, J. W., Eriksson, L., and Davies, J.A., Ion Implantation in Semiconductors: Silicon and Germanium (Academic Press, New York, 1970).Google Scholar
16.Gao, Y., J. Appl. Phys. 64, 3760 (1988).CrossRefGoogle Scholar
17.Wilson, R. G., Stevie, F. A., Lux, G. E., Kirschbaum, C. L., Frank, S., and Pallix, J., Surf. Coating Technol. 51, 358 (1992).CrossRefGoogle Scholar
18.Fleming, R. H., Meeker, G. P., and Blattner, R. J., Thin Solid Films 153, 197 (1987).CrossRefGoogle Scholar