Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-08T00:17:32.178Z Has data issue: false hasContentIssue false
  • English
  • Français

High-resolution transmission electron microscopy observations of La2Zr2O7 thin layers on LaAlO3 obtained by chemical methods

Published online by Cambridge University Press:  31 January 2011

L. Rapenne ,
C. Jiménez ,
T. Caroff ,
C. Million ,
S. Morlens ,
P. Bayle-Guillemaud  and
F. Weiss
L. Rapenne
Affiliation:
LMGP—UMR 5628 Centre national de la Recherche Scientifique (CNRS)—Grenoble INP, Grenoble 38016, France
C. Jiménez*
Affiliation:
LMGP—UMR 5628 Centre national de la Recherche Scientifique (CNRS)—Grenoble INP, Grenoble 38016, France
T. Caroff
Affiliation:
LMGP—UMR 5628 Centre national de la Recherche Scientifique (CNRS)—Grenoble INP, Grenoble 38016, France
C. Million
Affiliation:
LMGP—UMR 5628 CNRS—Grenoble INP, Grenoble 38016, France; and CRETA—Centre national de la Recherche Scientifique (CNRS) UPS2070, Grenoble 38042, France
S. Morlens
Affiliation:
CRETA—Centre national de la Recherche Scientifique (CNRS) UPS2070, Grenoble 38042, France
P. Bayle-Guillemaud
Affiliation:
CEA-Grenoble, INAC/SP2M/LEMMA, Grenoble 38054 cedex 9, France
F. Weiss
Affiliation:
LMGP—UMR 5628 Centre national de la Recherche Scientifique (CNRS)—Grenoble INP, Grenoble 38016, France
*
a) Address all correspondence to this author. e-mail: [email protected]
Get access

Abstract

La2Zr2O7 (LZO) films have been grown by metalorganic decomposition (MOD) to be used as buffer layers for coated conductors. LZO can crystallize into two similar structures: fluorite or pyrochlore. Coated conductor application focuses on pyrochlore structure because it is a good barrier against oxygen diffusion. Classical x-ray diffraction is not able to separate the contribution of these two structures. Transmission electron microscopy and high-resolution transmission electron microscopy were used to determine the local distribution of these two phases in epitaxial LZO layers grown on LaAlO3. A characteristic feature of LZO thin films deposited by MOD is the formation of nanovoids in an almost single-crystal structure of LZO pyrochlore phase. For comparison, LZO layers deposited by metalorganic chemical vapor deposition were also studied. In this last case, the film is compact without voids and the structure corresponds to pyrochlore phase. Thus, the formation of nanovoids is a characteristic feature of MOD grown films.

Keywords

Metalorganic depositionSuperconductingTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 24 , Issue 4 , April 2009 , pp. 1480 - 1491
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Shiohara, Y.Yoshizumi, M.Izumi, T. and Yamada, Y.: Present status and future prospect of coated conductor development and its application in Japan. Supercond. Sci. Technol. 21, 034002 (2008).Google Scholar
2Caroff, T.Morlens, S.Abrutis, A.Decroux, M.Chaudouët, P., Porcar, L.Saltyte, Z.Jiménez, C., Odier, P. and Weiss, F.: La2Zr2O7 single buffer layer for YBCO RABiTs coated conductors. Supercond. Sci. Technol. 21, 075007 (2008).Google Scholar
3Seo, J.W.Fompeyrine, J.Guiller, A.Norga, G.Marchiori, C.Siegwart, H. and Locquet, J.P.: Interface formation and defect structures in epitaxial La2Zr2O7 thin films on (111) Si. Appl. Phys. Lett. 83,(25) 5211 (2003).CrossRefGoogle Scholar
4Subramanian, M.A.Aravamudan, G. and Subba, G.V.Rao: Oxide pyrochlores-A review. Prog. Solid State Chem. 15, 55 (1983).Google Scholar
5Yu, Z.M.Odier, P.Ortega, L.Zhou, L.Zhang, P.X. and Girard, A.: La2Zr2O7 films on Cu-Ni alloy by chemical solution deposition process. Mater. Sci. Eng., B 130, 126 (2006).Google Scholar
6Ayache, J. and Albarede, P.H.: Application of the ionless tripod polisher to the preparation of YBCO superconducting multilayer and bulk ceramics thin films. Ultramicroscopy 60, 195 (1995).Google Scholar
7Molina, L.Knoth, K.Engel, S.Holzapfel, B. and Eibl, O.: Chemically deposited La2Zr2O7 buffer layers for YBCO-coated conductors: Film growth and microstructure. Supercond. Sci. Technol. 19, 1200 (2006).CrossRefGoogle Scholar
8Bayle-Guillemaud, P., Barbier, A. and Mocuta, C.: Development of a quantitative energy filtering TEM method to study a reactive NiO/80Ni20Fe interface. Ultramicroscopy 88, 99 (2001).Google Scholar
9Knoth, K.Hühne, R., Oswald, S.Molina, L.Eibl, O.Schultz, L. and Holzapfel, B.: Growth of thick chemical solution derived pyrochlore La2Zr2O7 buffer layers for YBa2Cu3O7-x coated conductors. Thin Solid Films 516, 2099 (2008).CrossRefGoogle Scholar
10Paranthaman, P.Sathyamurthy, S.Bhuiyan, M.S.Martin, P.M.Aytug, T.Kim, K.Fayek, M.Leonard, K.L.Li, J.Goyal, A.Kodenkandath, T.Li, X.Zhang, W. and Rupich, M.W.: MOD buffer/YBO approach to fabricate low-cost second generation HTS wires. IEEE Trans. Appl. Supercond. 17,(2) 3332 (2007).CrossRefGoogle Scholar
11Sathyamurthy, S.Paranthaman, M.Zhai, H.Y.Ayung, T.Cantoni, C.Leonard, K.J.Payzant, E.A.Christen, H.M.Goyal, A.Li, X.Schoop, U.Kodenkandath, T. and Rupich, M.W.: Chemical solution deposition of lanthanum zirco-nate barrier layer applied to low-cost coated conductor fabrication. J. Mater. Res. 19,(7) 2117 (2004).Google Scholar
12Heatherly, L.Hsu, H.Wee, S.H.Li, J.Sathyamurthy, S.Paranthaman, M. and Goyal, A.: Slot die coating and conversion of LZO on rolling assisted biaxially textured Ni-W substrates with and without a very thin seed layer in low vacuum. IEEE Trans. Appl. Supercond. 17,(2) 3417 (2007).CrossRefGoogle Scholar
13Bhuiyan, M.S.Parnathamn, M. and Salama, K.: Solution-derived textured oxide thin films-A review. Supercond. Sci. Technol. 19, R1 (2006).CrossRefGoogle Scholar
14Cao, X.Q.Vassen, R.Jungen, W.S.Schwartz, S.Tietz, F. and Stöver, D.: Thermal stability of lanthanum zirconate plasma sprayed coating. J. Am. Ceram. Soc. 84,(9) 2086 (2001).Google Scholar