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Growth of rare-earth niobate-based pyrochlores on textured Ni–W substrates with ionic radii dependency

Published online by Cambridge University Press:  01 April 2005

M.S. Bhuiyan*
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6100; and University of Houston, Houston, Texas 77204
M. Paranthaman
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6100
S. Sathyamurthy
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6100
A. Goyal
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6100
K. Salama
Affiliation:
University of Houston, Houston, Texas 77204
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

Epitaxial films of rare-earth (RE) niobates, RE3NbO7 with pyrochlore structures, were grown on biaxially textured nickel–3 at.% tungsten (Ni–W) substrates using a chemical solution deposition process. A precursor solution of 0.3–0.50 M concentration of total cations was spin coated on to short samples of Ni–W substrates, and the films were crystallized at 1050–1100 °C in a gas mixture of Ar–4% H2 for 15 min. Detailed studies revealed that RE-niobates with ionic radius ratio RRE/RNb (R = ionic radius) from 1.23 to 1.40 (i.e., Sm, Eu, Gd, Ho, Y, and Yb) grow epitaxially with the pyrochlore structure. X-ray studies showed that the films of pyrochlore RE niobate films were highly textured with cube-on-cube epitaxy. Scanning electron and atomic force microscopy investigations of RE3NbO7 films revealed a fairly dense and smooth microstructure without cracks and porosity. The rare-earth niobate layers may be potentially used as buffer layers for YBa2Cu3O7−δ coated conductors.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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Footnotes

b)

This author was an editor of this journal during the review and decision stage. For the JMR policy on review and publication of manuscripts authored by editors, please refer to http://www.mrs.org/publications/jmr/policy.html.

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